Wide-temperature range low-temperature environment test device

Abstract

The invention discloses a wide-temperature range low-temperature environment test device and relates to the field of low-temperature environment test. The wide-temperature range low-temperature environment test device comprises an insulation cabin body, a liquid nitrogen supply system, a gas nitrogen generating and regulating system, a heating system, a cooling system, a high-low temperature circulation pipeline system, a liquid accumulation preventing device and a measurement control system, wherein the gas nitrogen generating and regulating system comprises a liquid nitrogen vaporizer, a nitrogen pressure reducer, a nitrogen pipeline safety valve and a nitrogen pipeline electromagnetic valve; the insulation cabin body is divided into a static pressure chamber, a work space and a circulation air passage; the heating system comprises an electric heater in the circulation air passage and a solid relay; the cooling system comprises a liquid nitrogen wall evaporator, a secondary liquid nitrogen evaporator and a liquid nitrogen evaporator in the circulation air passage; and the high-low temperature circulation pipeline system connects the insulation cabin body, the liquid nitrogen supply system, the gas nitrogen generating and regulating system, the heating system and the cooling system to form a loop. According to the wide-temperature range low-temperature environment test device,an ultralow-temperature area test temperature environment can be achieved and the wide-temperature range low-temperature environment test device is uniform in temperature field, free of a liquid accumulation phenomenon, safe and reliable.

Description

technical field [0001] The invention relates to the field of low-temperature environment tests, in particular to a low-temperature environment test device with a wide temperature range. Background technique [0002] In the research and development process of important components such as aerospace equipment and precision electronic components, it is often necessary to provide a high and low temperature thermal environment to simulate the working environment of the components to test the function and performance of the components. Through searching the prior art, it is found that in CN200410078807.3, CN200910201130.0, CN201210424959.9 and CN201710043525.7 and other related patents that use non-mechanical refrigeration, the thermal test environment can usually only achieve a temperature range of -150°C and above. Limited by problems such as liquid nitrogen effusion and poor temperature field uniformity, it is usually difficult to achieve an ultra-low temperature range close to ...

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Problems solved by technology

Limited by problems such as liquid nitrogen effusion and poor temperature field uniformity, it is usually difficu

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