Self-adaptive large-depth-of-field three-dimensional scanning method and system

Abstract

The invention discloses a self-adaptive large-depth-of-field three-dimensional scanning method and system. The self-adaptive large-depth-of-field three-dimensional scanning method comprises the stepsof firstly, setting measurement step Delta d according to a measurement range, and calibrating a plurality of different measurement positions P1, P2 until Pn within the measurement range according tothe measurement step; secondly, preparing and arranging N structure light patterns with different bandwidth according to a sequence of bandwidth from large to small, and pre-generating a plurality ofstructure light pattern combinations S1, S2 until Sn according to distance of the measurement position relative to a projection device; thirdly, projecting arbitrary one of structure light pattern combinations Sx to a tested object within the measurement range, acquiring deformed structure light patterns projected onto a surface of the tested object again from two sides, determining a matching point in an image according to a gray level change relation of the structure light pattern image acquired at the two sides, and calculating a position Dx of the matching point relative to the projectiondevice; and finally, optimizing a next group of structure light pattern combination according to the position Dx. Therefore, the quality of acquisition structure light image is improved, and better measurement accuracy is obtained.

Description

technical field [0001] The invention relates to the technical field of three-dimensional scanning, in particular to an adaptive large depth-of-field three-dimensional scanning method and system. Background technique [0002] In recent years, 3D scanning technology has been widely used in the fields of industrial inspection, robot navigation, reverse engineering and target recognition. Especially in the field of industrial automation and robotics, it is necessary to obtain the precise three-dimensional size and surface shape of the measurement target. [0003] The current three-dimensional scanning technology includes contact and non-contact, and non-contact is divided into point scanning, line scanning and surface scanning technology. Non-contact surface scanning technology has been widely used in the field of industrial automatic detection and target recognition due to its advantages of fast scanning speed, high precision, and no damage to the measured target. [0004] St...

AI Technical Summary

Problems solved by technology

For some application scenarios with a large depth of field, such as random grabbing by a robotic arm or 3D visual navigation of a robot, the measurement range is large and the depth of field is wide, and the projection resolution of the structured light pattern is not enough for long-distance measurement, resulting in the structure of the light pattern collected by the image acquisition device. The amount of available data is too small, which seriously affects the accuracy of measurement

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