Device single event effect weak point surveying and mapping screening device and method

Abstract

The present invention proposes a device and method for surveying and identifying weak points of single event effect. Platform (15), controllable pulse laser emitter (16), CCD assembly (17) and industrial computer assembly (12); Described upper computer control module (11), is used for the moving position interval of setting and test mode parameter Send to industrial computer assembly (12); Also according to the failure data that industrial computer assembly (12) gathers, display and draw, obtain the sensitivity and the sensitive area when single event effect occurs in the device under test; Described industrial computer assembly (12 ), which is used to form a mobile control instruction according to the parameters received and set, and send it to the single event reversal detection component (13) and control the three-dimensional mobile platform (15); also upload the single event reversal state data and the CCD image to the host computer control module ( 11). The invention can survey, map and discriminate the physical position and time when the single event effect occurs on the device to be tested.

Description

technical field [0001] The invention relates to the fields of aerospace technology and semiconductor technology, in particular to a device and method for mapping and identifying weak points of single event effects of devices. Background technique [0002] Single event effect (Single event effect) refers to the phenomenon that high-energy charged particles generate a large amount of charge in the sensitive area of ​​the device. When particles with sufficient energy are injected into the integrated circuit, due to the ionization effect, the integrated circuit will generate a large number of electron-hole pairs. These sudden excess charges will cause the failure of the semiconductor device, causing the device to store bit flips or logic Level jumps lead to single event upset (single event upset) or single event function interrupt (single event function interrupt), which can cause CMOS devices to generate large currents and cause single event latch-up (single event latch-up). If...

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the defects that the test method in the prior art does not establish a joint test for multiple effects and for the time and space dynamic synchronization between the simulation device and the device under test, so as to provide a method that can perform a single test on the device under test. Time and space dynamic detection device and method during particle lock (SEL), single event transient (SET) and single event upset (SEU), the following Chinese and English abbreviations SEL represent described single event locking, SET represents single event transient, SEU stands for Single Event Upset

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