Device single-event effect weak point mapping screening device and method

Abstract

The invention provides a device single-event effect weak point mapping screening device and method, and the device comprises a host computer control module (11), a single-event flip detection component (13), a tested device loader (14), a three-dimensional mobile platform (15), a controllable pulsed laser emitter (16), a CCD component (17) and an industrial computer component (12), wherein the upper computer control module (11) is configured to send the set moving position interval and test mode parameters to the industrial computer component (12), display and plot according to the fault datacollected by the industrial computer component (12), and obtain the sensitivity and a sensitive area when the tested device has a single-event effect; and the industrial computer component (12) is configured to form a movement control instruction according to the received set parameters, send the instruction to the single-event flip detection component (13) to control the three-dimensional mobileplatform (15), and upload the single-event flip state data and the CCD image to the upper computer control module (11). The invention can perform mapping and discrimination on the physical position and time when the single-event effect of the tested device occurs.

Description

technical field [0001] The invention relates to the fields of aerospace technology and semiconductor technology, in particular to a device and method for mapping and identifying weak points of single event effects of devices. Background technique [0002] Single event effect (Single event effect) refers to the phenomenon that high-energy charged particles generate a large amount of charge in the sensitive area of ​​the device. When particles with sufficient energy are injected into the integrated circuit, due to the ionization effect, the integrated circuit will generate a large number of electron-hole pairs. These sudden excess charges will cause the failure of the semiconductor device, causing the device to store bit flips or logic Level jumps lead to single event upset (single event upset) or single event function interrupt (single event function interrupt), which can cause CMOS devices to generate large currents and cause single event latch-up (single event latch-up). If...

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the defects that the test method in the prior art does not establish a joint test for multiple effects and for the time and space dynamic synchronization between the simulation device and the device under test, so as to provide a method that can perform a single test on the device under test. Time and space dynamic detection device and method during particle lock (SEL), single event transient (SET) and single event upset (SEU), the following Chinese and English abbreviations SEL represent described single event locking, SET represents single event transient, SEU stands for Single Event Upset

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