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A terahertz imaging method and system and a nondestructive testing method and system

A terahertz imaging and terahertz technology, applied in the field of image processing, can solve the problems of reducing the real-time performance of the system, long scanning time, limited improvement of imaging effect, etc., to achieve the effect of enhanced clarity and contrast, good imaging effect and moderate brightness

Active Publication Date: 2021-03-16
JIMEI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, reducing the scan step size increases the amount of spectral data dramatically, and the scan time is too long, which seriously reduces the real-time performance of the system, especially for the detection of large components.
In addition, since the diffraction limit is closely related to the terahertz wavelength, the unlimited reduction of the spot size and the scanning step size is meaningless, and its imaging effect is limited.

Method used

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  • A terahertz imaging method and system and a nondestructive testing method and system
  • A terahertz imaging method and system and a nondestructive testing method and system
  • A terahertz imaging method and system and a nondestructive testing method and system

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Embodiment 1

[0084] figure 1 It is a flowchart of a terahertz imaging method provided by an embodiment of the present invention. Such as figure 1 Shown, a kind of terahertz imaging method, described method comprises:

[0085] Step 101: Obtain several time-domain spectral information file matrices of the detected object.

[0086] Step 102: Perform terahertz time-domain information imaging and terahertz frequency-domain information imaging according to the time-domain spectral information file matrix to obtain a terahertz time-domain image and a terahertz frequency-domain image.

[0087] Step 103: Construct an image library of the detected object according to the terahertz time-domain image and the terahertz frequency-domain image.

[0088] Step 104: Calculating the information entropy of the images in the image database whose frequency is lower than the cut-off frequency of the terahertz spectrum.

[0089] Step 105: Filter out the image with the largest information entropy as the standa...

Embodiment 2

[0112] figure 2 A structural block diagram of a terahertz imaging system provided by an embodiment of the present invention. Such as figure 2 Shown, a kind of terahertz imaging system, described system comprises:

[0113] The acquiring module 201 is configured to acquire several time-domain spectral information file matrices of the detected object.

[0114] The imaging module 202 is configured to perform terahertz time-domain information imaging and terahertz frequency-domain information imaging according to the time-domain spectral information file matrix to obtain a terahertz time-domain image and a terahertz frequency-domain image.

[0115] An image library construction module 203, configured to construct an image library of the detection object according to the terahertz time-domain image and the terahertz frequency-domain image.

[0116] An information entropy calculation module 204, configured to calculate the information entropy of the images in the image database ...

Embodiment 3

[0125] image 3It is a flowchart of a non-destructive testing method provided by an embodiment of the present invention. Such as image 3 Shown, a kind of non-destructive testing method, described non-destructive testing method comprises:

[0126] Step 301: Acquire a terahertz image of the detection object, the terahertz image is a fused terahertz image generated by the method described in Embodiment 1;

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Abstract

The invention discloses a terahertz imaging method and system, and a nondestructive testing method and system. In the imaging method and system, the terahertz image library includes terahertz time-domain images and frequency-domain images. First, the similarity measurement method is used to select several images with the highest similarity value with the standard image as the source image, and then the image fusion method based on wavelet transform is used to perform image fusion on the selected source images. The brightness of the fused image is moderate. There is basically no loss of information, the clarity and contrast have been enhanced to a certain extent, and the imaging effect is good. Moreover, when the present invention performs similarity measurement, the multi-dimensional vector calculation of a large number of SIFT feature points of two images is reduced to the measurement calculation between two K-dimensional vectors, which reduces the amount of calculation and computational complexity, and improves the real-time performance of the imaging method. Efficiency and implementation costs. When performing non-destructive testing on this basis, it can quickly and accurately identify the tiny features of the testing object, with fast detection speed and high detection accuracy.

Description

technical field [0001] The invention relates to the field of image processing, in particular to a non-destructive testing method and a terahertz imaging method and system, and a non-destructive testing method and system. Background technique [0002] The resolution of terahertz spectral images is low, which brings great difficulties to the identification of tiny features of sample targets. At present, for the terahertz time-domain spectral imaging system (THz-TDS), it is often used to improve the precision of optical hardware to obtain a smaller terahertz spot, or to reduce the scanning step of the two-dimensional scanning platform to obtain more scanning pixels. Points and other technical means to improve the spatial resolution of imaging. However, reducing the scan step size increases the amount of spectral data dramatically, and the scan time is too long, which seriously reduces the real-time performance of the system, especially for the detection of large components. I...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/62G06K9/46G06T5/50
CPCG06T5/50G06T2207/20221G06T2207/30168G06T2207/20064G06V10/462G06F18/23213
Inventor 蒋英兰郑佳春李铁军刘建军邵桂芳
Owner JIMEI UNIV