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A self-adaptive storage device loss leveling method and system

A storage device and loss leveling technology, which is applied in the computer field, can solve the problems that the storage medium cannot reasonably allocate the erasing times of the storage unit, and the storage device has a short service life, so as to prolong the reliable working time, save resources and time costs.

Active Publication Date: 2021-10-15
FUTUREPATH TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the defects of the prior art, the purpose of the present invention is to provide an adaptive storage device wear leveling method and system, aiming to solve the problem that the existing storage medium wear leveling processing method cannot reasonably allocate the number of erasures of each storage unit, resulting in storage The problem of short service life of the device

Method used

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  • A self-adaptive storage device loss leveling method and system
  • A self-adaptive storage device loss leveling method and system

Examples

Experimental program
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Embodiment

[0055] A solid-state hard disk under a certain manufacturing process is used as a storage system, and a storage block of a flash memory (NAND flash) under a certain manufacturing process is used as a storage unit.

[0056] (1) Carry out quality assessment to the non-volatile memory through the storage unit quality model, and establish a quality assessment table with the storage unit as the unit based on the quality assessment result;

[0057] More specifically, after the storage system is powered on and used, the data acquisition module collects the feature data in the training storage unit, and the feature data is input into the storage unit quality model; the storage unit quality model evaluates the quality of the entire non-volatile memory, and is established to store A quality assessment form in units of units, the quality assessment form consists of figure 2 The information storage module shown is saved;

[0058] Preferably, the value stored in the quality estimation ta...

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Abstract

The invention discloses an adaptive storage device loss equalization method and device, belonging to the field of computer technology, including: (1) evaluating the quality of a non-volatile memory through a storage unit quality model, and establishing a quality evaluation table; (2) If the quantization quality difference between the storage unit with the best quality and the storage unit with the worst quality in the quality evaluation table satisfies the threshold condition, reset the storage unit usage priority; (3) after receiving the data command, use the highest priority storage unit Erase and write the storage unit, and update the quality evaluation table and characteristic data corresponding to the storage unit; (4) for the storage unit that meets the preset conditions, input the characteristic data into the quality model of the storage unit to update the quality evaluation table corresponding to the storage unit; Conditional storage unit, go to step (2); (5) until the storage device is in normal use. The invention fully considers the erasing and writing times of the storage unit, and prolongs the reliable working time of the storage device.

Description

technical field [0001] The invention belongs to the technical field of computers, and more specifically relates to an adaptive storage device loss leveling method and system. Background technique [0002] Memory is a memory device used to save information in modern information technology. During the calculation process of electronic equipment, the input raw data, computer programs, intermediate operation results and final operation results are all stored in the memory, which is one of the core components of the development of modern information technology. At present, the memory on the market is mainly divided into: volatile memory and non-volatile memory. [0003] Under the structure of most existing memory chips, due to the influence of the semiconductor manufacturing process, the cells inside the chip will degenerate with the increase of the erasing and writing times, so that the memory chip will have errors in the storage process, and Eventually lead to chip failure. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/06
CPCG06F3/0616G06F3/0652G06F3/0679
Inventor 刘政林潘玉茜李腾飞林羽盛
Owner FUTUREPATH TECH
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