A structured light three-dimensional scanning method based on known marker points

A technology of three-dimensional scanning and marking points, which is applied in the field of three-dimensional scanners and can solve the problems of easy accumulation of errors, low positioning accuracy, and reduced scanning and positioning accuracy.

Active Publication Date: 2021-07-06
SCANTECH (HANGZHOU) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This splicing method is flexible to use, but the positioning accuracy is low, and it is easy to accumulate errors as the scanning continues to advance, and at the same time, the structured light is projected to scan the outline of the measured object and the marked point, and the two are easy when the light strip and the marked point coincide. Interaction effects, further reducing scanning and positioning accuracy

Method used

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  • A structured light three-dimensional scanning method based on known marker points
  • A structured light three-dimensional scanning method based on known marker points
  • A structured light three-dimensional scanning method based on known marker points

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings.

[0035] refer to Figure 1 to Figure 5 , a structured light three-dimensional scanning method based on known marker points, comprising the following steps:

[0036] S1, the establishment of the marker library, the process is as follows:

[0037] Do not turn on the projector, pre-scan the markers, and then automatically add the scanned markers to the marker library;

[0038] S2, object scanning and marker matching, the process is as follows:

[0039] S21, the projector projects structured light, and the camera captures and obtains the 3D outline point cloud data of the current frame of the object;

[0040] S22, identifying the marker points in the field of view of the current frame, and matching with the marker point library obtained in S1;

[0041] Note that new markers are not added to the marker library in step S2;

[0042] If the matching of the above steps is s...

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Abstract

A structured light three-dimensional scanning method based on known markers, comprising the following steps: S1, the establishment of a marker library, the process is as follows: do not turn on the projector, pre-scan markers, and then automatically add the scanned markers to the marker Point library; S2, object scanning and matching of marked points, the process is as follows: S21, the projector projects structured light, and the camera captures and obtains the 3D contour point cloud data of the current frame of the object; S22, identifies the marked points in the field of view of the current frame, and obtains in S1 If the above steps are successfully matched, then the conversion relationship from the current frame to the world coordinate system is obtained according to the matching result, and the 3D point cloud stitching is completed. The invention accurately and flexibly performs scanner positioning and three-dimensional point cloud data splicing.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional scanners, in particular to a structured light three-dimensional scanning method based on known marking points. Background technique [0002] The structured light 3D scanner is a device that uses the projected structured light method to obtain the 3D information of the measured object. It is currently widely used in industrial product inspection, reverse setting, simulation, positioning and other fields. [0003] In the process of 3D scanning, in order to obtain all-round 3D data of the scanned object, it is necessary to paste marker points on the surface of the measured object or around the object for scanner positioning and 3D point cloud data splicing. [0004] In the prior art, the method of using marked points for 3D data splicing is to obtain the marked points and the 3D contour point cloud of the measured object at the same time during the scanning process, and obtain the two-scan ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/25
CPCG01B11/002G01B11/2504G01B11/2518G01B11/2522G01B11/2545
Inventor 郑俊
Owner SCANTECH (HANGZHOU) CO LTD
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