Needle tip enhanced Raman spectrum microscopic imaging device
A technique of tip-enhanced Raman and microscopic imaging, which is applied in measurement devices, Raman scattering, material analysis by optical means, etc., can solve problems such as the decrease of incident light field intensity and the need for further improvement of Raman spectral signal intensity, etc. To achieve the effect of local electric field enhancement, improve spatial resolution, and enhance strength
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[0058] A needle-tip-enhanced Raman spectroscopy microscopic imaging device of this embodiment, such as Figure 1 to Figure 9 As shown, it includes an excitation light unit 10, a surface plasmon excitation unit 20, a surface plasmon field hybridization unit 30, an illumination unit 70, a scanning unit 40, a detection unit 50 and a monitoring unit 60; the excitation light unit 10 is used To generate radially polarized light beams, the generated radially polarized light beams are incident on the surface plasmon excitation unit 20; the surface plasmon excitation unit 20 is used to receive radially polarized light beams, irradiated by radially polarized light beams, and use The energy of the radially polarized light beam excites the surface plasmon light field; the scanning unit 40 includes a scanning probe 401; the scanning probe 401 is used to scan the sample to be tested, and the scanning probe is also used to interact with the surface plasmon The surface plasmon field hybridiza...
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