A winter wheat yield prediction method and system

A technology for winter wheat yield per unit area, which is applied in the field of winter wheat yield prediction method and system, can solve the problems of large input data, response lag, and failure to reflect the increase of yield well, and achieve the effect of accurate estimation results and high applicability

Active Publication Date: 2022-03-08
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

[0007] Among the three methods, the first method is the simplest and requires the least data. The latter two methods are more mechanical, but require a large amount of input data and the operation is more complicated.
Although the construction of remote sensing yield estimation model using vegetation has achieved great success, there are still some problems, such as NDVI is easily saturated in high vegetation coverage areas, there is a lag in response to disasters (such as drought, pests and diseases), and the accuracy of yield estimation Difficult to guarantee, cannot well reflect the trend of increasing yield brought about by agricultural management and scientific and technological progress

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  • A winter wheat yield prediction method and system
  • A winter wheat yield prediction method and system
  • A winter wheat yield prediction method and system

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[0065] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0066] The object of the present invention is to provide a winter wheat yield prediction method and system, which can accurately predict the winter wheat yield.

[0067] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0068] like figure 1 Shown, a kind of winter whea...

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Abstract

The invention relates to a winter wheat yield prediction method and system, which calculates the cumulative average enhanced vegetation index of the area to be measured, the cumulative average enhanced vegetation index of the area to be measured and the technical yield of the area to be measured, and uses the multiple linear regression method of the least square method to establish the market. Yield estimation model and provincial yield estimation model, and use the two models to monitor and predict the yield of winter wheat. The yield estimation model established by the invention has high applicability to the estimation of crop per unit yield at municipal and provincial levels, the estimation result is accurate, and dynamic yield forecast can be realized, which is conducive to timely understanding of the growth status and changes of winter wheat.

Description

technical field [0001] The invention relates to the technical field of agricultural engineering, in particular to a winter wheat yield prediction method and system. Background technique [0002] Remote sensing agricultural monitoring has the advantages of large-scale observation, high time resolution, and objective and reliable data. It saves time and cost compared with the traditional yield estimation method with heavy workload, high cost, and low efficiency, and provides a scientific and effective means for crop yield estimation. [0003] There are three methods for crop yield estimation using remote sensing: remote sensing statistical yield estimation model, dry matter-yield model and crop model simulation. [0004] The remote sensing statistical production estimation model estimates production by establishing the relationship expression between remote sensing variables and production. [0005] The dry matter-yield model first estimates the aboveground biomass of crops b...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q50/02G06V10/143
CPCG06Q10/04G06Q50/02G06V10/143
Inventor 朱秀芳郭锐
Owner BEIJING NORMAL UNIVERSITY
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