M2M module test method and device

Abstract

The invention relates to an M2M module test method and device. The M2M module comprises a control module and at least one function extension pin. The device comprises a test fixture, and the test fixture is electrically connected with the control module. Each function extension pin of the M2M module is connected to the test fixture through a connecting wire or a test needle. The control module isused for configuring each function extension pin as a universal input / output port during testing, then executing a test operation on each successfully configured function extension pin, and judging whether each function extension pin is normal or not according to a test result. On one hand, the function pin test of the M2M module can be realized, and on the other hand, the problem that the M2M module needs to be reworked or scrapped due to the fact that the pins of the M2M module are led out to the DAQ is avoided. Besides, since the pins of the M2M module do not need to be led out to the DAQ,repeated handshake, control and delay waiting between the pins and the DAQ can be correspondingly omitted, and the whole test time is saved.

Description

technical field [0001] The present invention relates to the technical field of circuit testing, in particular to an M2M module testing method and device. Background technique [0002] M2M (Machine to Machine) refers to a machine-to-machine connection and communication relationship in industrial equipment, and an M2M communication device is a device that realizes this communication relationship. At present, DAQ (Data acquisition, data acquisition) is usually used to test the pins of the M2M module. In order to implement the test, it is necessary to lead all the pins of the M2M module to the DAQ. [0003] Since it is necessary to connect each pin of the module to the DAQ, it is easy to introduce some high-energy voltage when the lead wire is in contact with the outside world, which will damage the internal chip of the module. At the same time, due to various complex environments outside, many factors (static electricity, surge) will pass If the M2M module is damaged due to th...

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Problems solved by technology

[0003] Since it is necessary to connect each pin of the module to the DAQ, it is easy to introduce some high-energy voltage when the lead wire is in contact with the outside world, which will damage the internal chip of the module. At the same time, due to various complex environments outside, many factors (static electricity, surge) will pass If the M2M module is damaged due to this method, the corresponding production line will often report that the corresponding pin function of the M2M module is invalid, so the module has to be reworked or scrapped, resulting in production losses

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