Pressing tool for testing microwave device

Abstract

The invention discloses a pressing tool for testing a microwave device, which comprises a bottom plate, screws, a pressing block and a pressing plate, the pressing block and the pressing plate are arranged separately, the bottom plate is a hard metal strip plate, the two screws are vertically and fixedly mounted on the bottom plate, an insulating layer is arranged on the bottom plate, and a bottomplate groove is formed in the insulating layer; the pressing block is a long strip block made of hard insulation, the length of the pressing block is smaller than the distance between the two screws,the width of the pressing block is smaller than the width of the bottom plate, and a pressing block groove matched with a microwave device to be measured is formed in the lower end face of the pressing block. The pressing plate is made of hard metal materials, and the length of the pressing plate is larger than the distance between the two screws. According to the pressing tool, due to the arrangement of the test microstrip line, the brass contact part and the protrusion, the tool can press the microwave device end pin and the brass contact part, the tightness between the microwave device endpin and the test microstrip line is improved, and effective connection between the microwave device end pin and the test microstrip line in the test process can be ensured.

Description

technical field [0001] The invention relates to the technical field of microwave measurement, in particular to a compression tool for testing microwave devices. Background technique [0002] Most of the connecting cables of microwave test instruments are coaxial cables, so when designing microwave devices, the input and output interfaces are generally designed as coaxial interfaces to facilitate the testing of microwave devices. In order to verify the DC and microwave characteristics of microwave devices, a test fixture is required in the test process, and the input and output terminals of the device are connected to the microstrip line of the test fixture to realize DC and microwave testing. Several important test indicators for device testing are stability, accuracy, and nondestructiveness. Nondestructiveness means that the testing process cannot cause device damage. If the input and output terminals are not tightly connected to the test microstrip line, it is easy to cau...

AI Technical Summary

Problems solved by technology

One method is to use solder to solder. After the test of this method is completed, it is necessary to use a soldering iron to melt the solder to remove the device. The operation is very inconvenient. If the device needs to be tested multiple times, frequent use of the soldering iron will cause the reliability of the microstrip line of the test fixture. drop, and cause mechanical and thermal damage to the device terminals; another method is to bend the terminals to the direction of the test microstrip line to achieve hard contact. This method is likely to cause mechanical damage to the device terminals, and with the continuous release of the bending stress, the terminals The contact with the test microstrip line will become less and less close, which will easily cause the saturation current curve to be distorted during the DC test, and the test value will be smaller than the real value. The test value of power and efficiency is less than the real value

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