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Method for extracting phase information by near-field optical microscope based on probe array

A probe array and phase information technology, applied in the field of scanning near-field optical microscopy, can solve problems such as experimental limitations and the inability to directly detect the surface wave phase, and achieve the effect of improving the overall scientific research level.

Active Publication Date: 2020-05-15
四川见微知著科技有限公司
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Problems solved by technology

The resolution of the scattering near-field optical microscope is relatively high, and the development has been faster and faster in recent years. However, the traditional scattering near-field optical microscope can only detect the electric field intensity on the surface of the sample, but cannot directly detect the phase of the surface wave. many limitations to the experiment

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  • Method for extracting phase information by near-field optical microscope based on probe array
  • Method for extracting phase information by near-field optical microscope based on probe array

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Embodiment Construction

[0015] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0016] by figure 1 The a-type double-probe scanning near-field optical microscope is taken as an example to illustrate the specific implementation. (1) in the figure is the probe. In this embodiment, the scanning near-field optical microscope based on the probe array uses two non-aperture near-field scattering probes with a distance of d. The value of d is related to the frequency band of the near-field optical microscope. In the present embodiment, the near-field optical microscope works in the wave band of 0.1-3THz (wavelength is 100-3000 μm). In the case of wave vector compression, d=100 μm is not considered. . As the frequency increases, the value of d can be taken to the nanometer level. The vibration frequency Ω of each probe is different, which is controlled by changing its material or size or applying an applied voltage. The tip size of the ...

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Abstract

The invention discloses a method for extracting phase information by a near-field optical microscope based on a probe array, and belongs to the technical field of scanning near-field optical microscopes. The method comprises: in the scattering type scanning near-field optical microscope, using two or more probes to form an array to replace traditional single-probe excitation; scattering signals ofeach probe are distinguished through different vibration frequencies omega, so that the difference of near-field signal intensities at different positions of a sample is measured at the same time, and the phase of the surface wave is calculated. Improvement is made on the basis of a traditional single-probe scattering type near-field microscope, the field intensity and the phase of evanescent waves on the surface of a material or biological tissue can be obtained at the same time, and near-field characteristics of a measured sample can be known more visually.

Description

technical field [0001] The invention belongs to the technical field of scanning near-field optical microscopy, and relates to scattering type-Scanning Near-field Optical Microscopy (scattering type-Scanning Near-field Optical Microscopy, s-SNOM for short) of various bands. Background technique [0002] The near field, the evanescent field, is bound to the surface of the object and decays exponentially away from the surface. For a long time, it has been a recognized problem to break through the diffraction limit and detect the near-field characteristics of the object surface. In 1928, Sir Edward Hutchinson Synge first proposed the idea of ​​near-field microscopy. In order to break through the limitation of the traditional diffraction limit, a probe with nanometer-level resolution is used to enter the near-field region of the sample to be measured. Not only can the incident light be coupled into evanescent waves, but also the evanescent field can be converted into a propagat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/18G01Q60/22
CPCG01Q60/18G01Q60/22
Inventor 胡旻王月莹张天宇张倬铖张晓秋艳许星星吴振华刘頔威刘盛纲
Owner 四川见微知著科技有限公司