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Ion injection into multi-pass mass spectrometers

A mass spectrometer and spectrum analysis technology, applied in the field of control of drift ion movement and improved injection mechanism, can solve the problems that the method of compensating the misalignment of the analyzer has not been developed, and the solution is limited.

Active Publication Date: 2020-05-15
MICROMASS UK LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, these solutions are limited and methods to compensate for analyzer misalignment have not been developed

Method used

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  • Ion injection into multi-pass mass spectrometers
  • Ion injection into multi-pass mass spectrometers
  • Ion injection into multi-pass mass spectrometers

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Embodiment 70

[0179] Figure 8 An embodiment 70 of an MPTOF mass analyzer of the present invention is shown comprising: a sector multi-turn analyzer 81 with a two-dimensional field (also shown in the X-Y plane), i.e. without the laminate of embodiment 20; tilt OA 64 ; compensation deflector 40 , a pair of telescoping compensation deflectors 82 and 83 ; and compensation deflector 78 in front of detector 17 .

[0180] similar to Figure 5-Figure 7 , ion implantation employs a tilted OA 64 and compensating deflector 40 to use the increased energy Uz of the ion beam, thereby reducing the tilt angle to α 2 , while making the time front parallel to the Z axis γ 2 =0. The analyzer 81 has a zero field Ez in the Z direction, therefore, the packet 85 is at an angle α 2 And gamma 2 =0 reaches the deflector 82 .

[0181] Deflectors 82 and 83 are arranged for spatial focusing 82 and defocusing 83 by quadrupole fields. The pair produces telescopic packet compression, and then expands the ion packe...

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Abstract

An improved multi-pass time-of-flight or electrostatic trap mass spectrometer (70) with an orthogonal accelerator, applicable to mirror based multi-reflecting (MR) or multi-turn (MT) analyzers. The orthogonal accelerator (64) is tilted and after first ion reflection or turn the ion packets are back deflected with a compensated deflector (40) by the same angle alpha to compensate for the time-frontsteering and for the chromatic angular spreads. The focal distance of deflector (40) is control by Matsuda plates or other means for producing quadrupolar field in the deflector. Interference with the detector rim is improved with dual deflector (68). The proposed improvements allow substantial extension of flight path and number of ion turns or reflections. The problems of analyzer angular misalignments by tilting of ion mirror (71) is compensated by electrical adjustments of ion beam (63) energy and deflection angles in deflectors (40) and (68).

Description

[0001] Cross References to Related Applications [0002] This application claims UK Patent Application No. 1712612.9, UK Patent Application No. 1712613.7, UK Patent Application No. 1712614.5, UK Patent Application No. 1712616.0, UK Patent Application No. 1712617.8, UK Patent Application No. 1712617.8, each filed on 6 August 2017 Priority and benefit of Application No. 1712618.6 and UK Patent Application No. 1712619.4. The entire contents of these applications are incorporated herein by reference. technical field [0003] The present invention relates to multi-pass time-of-flight mass spectrometers (MPTOF MS) [such as multi-turn (MT) and multi-reflection (MR) TOF MS with orthogonal pulse converter, and electrostatic ion trap mass spectrometer E-Trap MS] field, and more specifically to improved injection mechanisms and control of drift ion motion in MPTOF analyzers. Background technique [0004] Orthogonal accelerators are widely used in time-of-flight mass spectrometers (TO...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/40H01J49/06
CPCH01J49/062H01J49/401H01J49/403H01J49/0031H01J49/022H01J49/025H01J49/061H01J49/067H01J49/406H01J49/4245
Inventor 阿纳托利·凡尔纳奇科夫
Owner MICROMASS UK LTD