Paper defect detection method based on near-field uniform illumination
A technology for uniform illumination and paper defect detection, applied in measurement devices, optical testing flaws/defects, instruments, etc., can solve the problems of cumbersome operation, high algorithm complexity, complex modeling of light source system structure, etc., to improve imaging quality, Low algorithm complexity and improved image quality
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[0033] A specific embodiment of the present invention will be described in detail below with reference to the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiment.
[0034] Aiming at the problem of uneven horizontal grayscale in the images collected in the paper defect detection system, the present invention is based on the geometrical optics irradiance theory and focuses on the problem of uniform distribution of illumination on the detected paper by the light source module of the paper defect detection system. Luo's law determines the optimal distance function between the LED lamp beads in the light source module; from the perspective of machine vision, determines the power optimization function of the lamp beads at different positions in the light source array; using the image gray uniformity index, the light source The improvement effect was verified.
[0035] In the paper disease det...
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