Crystal bar slicing method

A crystal ingot and slicing technology, which is applied to fine working devices, stone processing equipment, manufacturing tools, etc., can solve problems such as material waste, wafer damage, and component expansion, so as to simplify the processing flow, avoid mechanical damage, and reduce The effect of kerf loss

Inactive Publication Date: 2020-06-12
ZING SEMICON CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, the use of wire cutting technology to cut crystal rods cannot avoid kerf loss
In a typical cutting process, a kerf loss of 200μm-250μm is often generated, resulting in a large amount of material waste and additional costs for recycling raw materials
At the same time, during the wire cutting process, a large amount of heat is often generated, which causes the parts to expand, making it impossible to accurately control the wafer shape
The steel wire is often coated with diamond grains, which often cause physical damage to the wafer. During the cutting process, as the steel wire enters and exits in the crystal column, it also causes warping of the wafer after cutting.

Method used

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Embodiment Construction

[0031] In the following description, a lot of specific details are given in order to provide a more thorough understanding of the present invention. However, it is obvious to those skilled in the art that the present invention can be implemented without one or more of these details. In other examples, in order to avoid confusion with the present invention, some technical features known in the art are not described.

[0032] In order to thoroughly understand the present invention, a detailed description will be provided in the following description to illustrate the ingot cutting method of the present invention. Obviously, the implementation of the present invention is not limited to the specific details familiar to those skilled in the semiconductor field. The preferred embodiments of the present invention are described in detail as follows. However, in addition to these detailed descriptions, the present invention may also have other embodiments.

[0033] It should be noted that...

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Abstract

The invention provides a crystal bar slicing method. The method comprises that: (S1) a crystal bar is at least partially dipped in an electrolytic tank including an electrolyte, wherein a cathode including a linear electrode is arranged in the electrolytic tank; (S2) relative positions between the crystal bar and the cathode are adjusted, so that the axial direction of the crystal bar is intersected with the length direction of the linear electrode, and the crystal bar is not contacted with the linear electrode; and (S3) when a power supply is communicated between the crystal bar and the cathode, the crystal bar and the linear electrode on the cathode perform a relative motion, wherein the power supply comprises a direct-current power supply, the crystal bar communicates with the positivepole of the direct-current power supply, and the cathode communicates with the negative pole of the direct-current power supply; and slicing of the crystal bar is implemented through the relative motion. According to the crystal bar slicing method, the section loss is effectively reduced, and meanwhile, the mechanism loss, wafer warpup and pollution caused by contact cutting are effectively prevented.

Description

Technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for slicing an ingot. Background technique [0002] At present, the cutting of ingots is dominated by mechanical wire cutting in which steel wire drives slurry. The principle is to use a high-speed moving steel wire to drive the cutting blade material attached to the steel wire to rub the silicon rod to achieve the cutting effect. [0003] Since steel wire is used in the wire cutting process, it is easy to introduce contaminants such as Cu and Fe. At the same time, the wire cutting process is used to cut the ingot, which cannot avoid the loss of section. In a typical cutting process, a cut-off loss of 200μm-250μm is often generated, resulting in a large amount of material waste and additional costs for recycling the raw materials. At the same time, in the in-line dicing process, a lot of heat is often generated, which in turn causes the parts to expand, which makes...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): B28D5/04
CPCB28D5/04
Inventor王刚沈伟民
OwnerZING SEMICON CORP