Supercharge Your Innovation With Domain-Expert AI Agents!

Fault diagnosis tree generation method based on information entropy and dynamic programming

A dynamic programming and fault diagnosis technology, applied in electronic circuit testing, complex mathematical operations, measuring devices, etc., can solve the problem of high algorithm time complexity

Pending Publication Date: 2020-06-12
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the search process of the same fault set in the AO* algorithm, the time complexity of the algorithm is too high, resulting in limitations in practical applications

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault diagnosis tree generation method based on information entropy and dynamic programming
  • Fault diagnosis tree generation method based on information entropy and dynamic programming
  • Fault diagnosis tree generation method based on information entropy and dynamic programming

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0059] figure 1 It is a flowchart of a method for generating a fault diagnosis tree based on information entropy and dynamic programming of the present invention.

[0060] In this embodiment, such as figure 1 As shown, a method for generating a fault diagnosis tree based on information entropy and dynamic programming of the present invention includes the following steps:

[0061] S1, build fault test model H;

[0062] H={S,T,D,P,C}

[0063] Among them, S represents the set of various faults in the system under test, S={s 1 ,s 2 ,...,S M }, M is the total number of faults; T represents the set of all available measuring points of the system under test, T={t 1 ,t 2 ,...,T N }, N is the total number of available measuring points; P represents the prior probability set of a certain failure of the system under test, P={p 1 ,p 2 ,...,P M }, p i Indicates a failure s i The prior probability of i=1,2,...,M; C represents the test cost set corresponding to T, C={c 1 ,c 2 ,...,C N }; D is the f...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fault diagnosis tree generation method based on information entropy and dynamic planning, and the method comprises the steps: obtaining the relation between the internal fault state of an electronic system and the output of a measurement point in a circuit based on a dependence matrix, and constructing a dynamic planning list to search an optimal solution; secondly, screening effective measuring points from the fault set in the dynamic planning list, selecting the effective measuring points according to the information entropy to expand the search depth, and avoidingrepeated search of the same fault set through the dynamic planning list, so that the search frequency is reduced, and the optimal diagnosis tree can be quickly generated.

Description

Technical field [0001] The invention belongs to the technical field of circuit fault diagnosis, and more specifically, relates to a method for generating a fault diagnosis tree based on information entropy and dynamic programming. Background technique [0002] With the increasing development of electronic technology, the internal circuit design of the equipment system is becoming more and more complicated. The timely and accurate determination of the circuit status and the isolation of internal faults can effectively shorten the development, experiment and release time of the electronic system and improve the testability of the equipment system. How to design an efficient fault test program has become one of the research hotspots in the field of electronic design. [0003] However, the complexity of the equipment system is rising, and the maintenance cost continues to increase. When the equipment system fails, it is difficult to quickly diagnose and locate the equipment system. The...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/16G01R31/28
CPCG06F17/16G01R31/2843
Inventor 刘震杜立梅文娟杨成林周秀云
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com