Fault diagnosis tree generation method based on information entropy and dynamic programming

A dynamic programming and fault diagnosis technology, applied in electronic circuit testing, complex mathematical operations, measuring devices, etc., can solve the problem of high algorithm time complexity

Pending Publication Date: 2020-06-12
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the search process of the same fault set in the AO* algorithm, the time complexity of the algorithm is too high, resulting in limitations in practical applications

Method used

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  • Fault diagnosis tree generation method based on information entropy and dynamic programming
  • Fault diagnosis tree generation method based on information entropy and dynamic programming
  • Fault diagnosis tree generation method based on information entropy and dynamic programming

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Embodiment

[0059] figure 1 It is a flowchart of a method for generating a fault diagnosis tree based on information entropy and dynamic programming of the present invention.

[0060] In this embodiment, such as figure 1 As shown, a method for generating a fault diagnosis tree based on information entropy and dynamic programming of the present invention includes the following steps:

[0061] S1, build fault test model H;

[0062] H={S,T,D,P,C}

[0063] Among them, S represents the set of various faults in the system under test, S={s 1 ,s 2 ,...,S M }, M is the total number of faults; T represents the set of all available measuring points of the system under test, T={t 1 ,t 2 ,...,T N }, N is the total number of available measuring points; P represents the prior probability set of a certain failure of the system under test, P={p 1 ,p 2 ,...,P M }, p i Indicates a failure s i The prior probability of i=1,2,...,M; C represents the test cost set corresponding to T, C={c 1 ,c 2 ,...,C N }; D is the f...

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Abstract

The invention discloses a fault diagnosis tree generation method based on information entropy and dynamic planning, and the method comprises the steps: obtaining the relation between the internal fault state of an electronic system and the output of a measurement point in a circuit based on a dependence matrix, and constructing a dynamic planning list to search an optimal solution; secondly, screening effective measuring points from the fault set in the dynamic planning list, selecting the effective measuring points according to the information entropy to expand the search depth, and avoidingrepeated search of the same fault set through the dynamic planning list, so that the search frequency is reduced, and the optimal diagnosis tree can be quickly generated.

Description

Technical field [0001] The invention belongs to the technical field of circuit fault diagnosis, and more specifically, relates to a method for generating a fault diagnosis tree based on information entropy and dynamic programming. Background technique [0002] With the increasing development of electronic technology, the internal circuit design of the equipment system is becoming more and more complicated. The timely and accurate determination of the circuit status and the isolation of internal faults can effectively shorten the development, experiment and release time of the electronic system and improve the testability of the equipment system. How to design an efficient fault test program has become one of the research hotspots in the field of electronic design. [0003] However, the complexity of the equipment system is rising, and the maintenance cost continues to increase. When the equipment system fails, it is difficult to quickly diagnose and locate the equipment system. The...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/16G01R31/28
CPCG06F17/16G01R31/2843
Inventor 刘震杜立梅文娟杨成林周秀云
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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