Voltage sag characteristic quantity random evaluation method based on scene construction
A voltage sag and feature quantity technology, applied in computer components, data processing applications, instruments, etc., can solve the problems of voltage sag feature quantity evaluation calculation, limited application, and large amount of calculation that have not been applied, so as to avoid The effect of a large number of repeated experiments, reducing random errors, and reducing the number of calculations
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[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0033] The random evaluation method of voltage sag characteristic quantities constructed based on scenarios in this embodiment is a method for evaluating voltage sag characteristic quantities based on monitoring data such as the distribution grid structure, relay protection parameters, and short-circuit faults.
[0034] This embodiment is implemented through the following technical solutions: figure 1 As shown, a method for randomly evaluat...
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