Fluorescence radiography examination system based on 785nm-wavelength light source
A 785nm, contrast-enhanced inspection technology, which is applied in the fields of analysis using fluorescence emission, medical science, sensors, etc., can solve problems such as inconvenient application, failure to display unexcited parts, troubles in the operation process, etc., so as to avoid the impact on the screen and improve the operation Efficiency and correctness, the effect of improving the image signal-to-noise ratio
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.
[0020] refer to Figure 1-2 , a fluoroscopy inspection system based on a 785nm wavelength light source, comprising a near-infrared laser light source 100, a visible light illumination source 200, a light collector 300, a beam splitter 400, a visible light filter 500, a near-infrared filter 600, and a color camera 700, a near-infrared camera 800, a terminal display 900, a housing 1 for contacting with the patient's body tissue 2, a light source bracket 11 is arranged inside the housing 1, and a near-infrared laser light source 100 and a visible light source 200 are arranged on the light source bracket 11 Above, the housing 1 is provided with an observation channel 12,...
PUM
| Property | Measurement | Unit |
|---|---|---|
| wavelength | aaaaa | aaaaa |
| wavelength | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 

