Nanoscale-resolution rapid solid dielectric space charge measurement system and method
A technology of solid dielectric and space charge, which is applied to measuring devices, measuring electrical variables, instruments, etc., and can solve problems such as shortening the life of cable insulation
Active Publication Date: 2020-08-07
TSINGHUA UNIV +1
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Problems solved by technology
In fact, the scale of cable insulation defects is usually at the micronano level. Once defects are formed in the insulating material, the insulation life of the cable will be greatly reduced.
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[0031] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
[0032] The following describes the fast solid dielectric space charge measurement system and method with nanoscale resolution according to the embodiments of the present invention with reference to the accompanying drawings. First, the fast solid dielectric space charge with nanoscale resolution according to the embodiments of the present invention will be described with reference to the accompanying drawings measuring system,.
[0033] figure 1 It is a structural schematic diagram of a fast solid dielectric space charge measure...
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The invention discloses a nanoscale-resolution rapid solid dielectric space charge measurement system and method. The system comprises a terahertz excitation assembly which is used for exciting terahertz electromagnetic waves, a rapid scanning assembly which is used for changing the matching state between detection light and excitation light, a space charge signal excitation assembly which is usedfor exciting a space charge signal, a detection and control link assembly which is used for detecting the space charge signal to obtain a space charge measurement result. The system is based on a rapid scanning terahertz technology. A stable and rapid multi-arm rotating optical delayer and a terahertz pressure wave sensor are used; and therefore, space charge measurement with the spatial resolution reaching tens of nanometers and the single measurement time reaching the second level is realized, and the problems of insufficient spatial resolution, large background noise interference, low signal-to-noise ratio and lack of charge characteristics representing micro-nano defects in an insulating material in a conventional space charge measurement method are effectively solved.
Description
technical field [0001] The invention relates to the technical field of performance testing of solid dielectric materials, in particular to a fast solid dielectric space charge measurement system and method with nanoscale resolution. Background technique [0002] DC cables are an important power transmission method to solve the problems of large-scale power transmission and new energy consumption, and are also the main solution for cross-sea power transmission and future large-scale urban power transmission and distribution networks. In the past ten years, the voltage level of DC cables has achieved a four-level jump from ±160kV to ±500kV, and the line length exceeds 5000km. With more than ten years of development and application history, the understanding of insulation material characteristics and structural design verification of newly put into operation power cable products is insufficient. The increase in voltage level and capacity will bring more serious insulation aging...
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IPC IPC(8): G01R29/24
CPCG01R29/24
Inventor 周远翔黄欣张云霄张灵滕陈源陈健宁胡德雄赵云舟
Owner TSINGHUA UNIV