Defect detection method and device, defect detection equipment and computer storage medium
A defect detection and defect technology, applied in computing, image data processing, instruments, etc., can solve problems such as inaccurate detection results and inaccurate product defect detection.
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[0096] Based on the first embodiment, a second embodiment of the method of the present invention is proposed. In this embodiment, step S31 includes,
[0097] Step S311, performing preprocessing on the low-frequency image to obtain a region to be detected corresponding to the low-frequency image;
[0098] Step S312, expanding the area to be detected to obtain an expanded area;
[0099] Step S313, performing surface fitting on the region to be detected and the extended region to obtain a defect image.
[0100] In this embodiment, after the low-frequency image is obtained, the low-frequency image is preprocessed to obtain the defect area corresponding to the low-frequency image. In this embodiment, grayscale is used to preprocess the low-frequency image. Specifically, the steps S311 also includes,
[0101] Step S3111, performing grayscale processing on the low-frequency image to obtain a first grayscale image;
[0102] Step S3112, performing low-pass filtering processing on th...
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