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Defect detection method and device, defect detection equipment and computer storage medium

A defect detection and defect technology, applied in computing, image data processing, instruments, etc., can solve problems such as inaccurate detection results and inaccurate product defect detection.

Pending Publication Date: 2020-08-07
广州柔视智能科技有限公司
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a defect detection method, device, defect detection equipment and computer storage medium, aiming to solve the technical problems of inaccurate product defect detection and inaccurate detection results in current defect detection

Method used

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  • Defect detection method and device, defect detection equipment and computer storage medium
  • Defect detection method and device, defect detection equipment and computer storage medium
  • Defect detection method and device, defect detection equipment and computer storage medium

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no. 1 example

[0096] Based on the first embodiment, a second embodiment of the method of the present invention is proposed. In this embodiment, step S31 includes,

[0097] Step S311, performing preprocessing on the low-frequency image to obtain a region to be detected corresponding to the low-frequency image;

[0098] Step S312, expanding the area to be detected to obtain an expanded area;

[0099] Step S313, performing surface fitting on the region to be detected and the extended region to obtain a defect image.

[0100] In this embodiment, after the low-frequency image is obtained, the low-frequency image is preprocessed to obtain the defect area corresponding to the low-frequency image. In this embodiment, grayscale is used to preprocess the low-frequency image. Specifically, the steps S311 also includes,

[0101] Step S3111, performing grayscale processing on the low-frequency image to obtain a first grayscale image;

[0102] Step S3112, performing low-pass filtering processing on th...

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Abstract

The invention discloses a defect detection method and device, defect detection equipment and a computer storage medium, and the method comprises the steps: inputting an image, and carrying out the wavelet transformation of the image for many times; respectively obtaining a target image set corresponding to each wavelet transform in the multiple wavelet transforms, the target image set comprising alow-frequency image and high-frequency images in three directions corresponding to the low-frequency image; and carrying out post-processing on the target image set to obtain a defect reconstructionmap; and performing curved surface fitting-based defect detection on each low-frequency image; performing defect reconstruction by using corresponding high-frequency images, so that defects with different shapes and random positions are effectively detected, defects with different sizes are effectively detected by adopting multi-scale analysis of wavelet transform, and the precision and the accuracy of defect detection are improved.

Description

technical field [0001] The invention relates to the field of defect detection, in particular to a defect detection method, device, defect detection equipment and computer storage medium. Background technique [0002] The defect imaging system mainly includes: camera, lens and light source. According to the specific needs of customers, the system selects appropriate cameras, lenses and light sources to image defects. The defect automatic detection part is the brain of the entire visual inspection system. The automatic detection of defects using image processing technology is the core of the entire system. Although various detection algorithms continue to appear, they still do not meet the requirements of practical applications in practical applications. There is still a certain gap in the demand, usually due to the different shapes and sizes of defects, the test results are not accurate, and there are consequences of errors. [0003] The above content is only used to assist...

Claims

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Application Information

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IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/20064Y02P90/30
Inventor 朱姗姗彭奕文王佳
Owner 广州柔视智能科技有限公司
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