Chip screening equipment

Abstract

The invention discloses chip screening equipment. The chip screening equipment is characterized by structurally comprising a workbench, a detecting table, a sorting mechanism, a test board and supporting legs, wherein the bottom of the workbench is equipped with four supporting legs; the upper end of the workbench is provided with the detecting table and the test board; the test board is matched with the detecting table and the sorting mechanism; the sorting mechanism is of a three-foot type, and consists of a rotary shaft, a pushing plate, sorting guide parts, a transfer joint and plate racks, the rotary shaft is connected to the three plate racks, the plate racks are horizontally and linearly equipped with two or more sorting guide parts, and the transfer joint is mechanically connectedto the other ends, opposite to the rotary shaft, of the plate racks. The sorting mechanism is provided with the three plate racks, so that distinguishing can be achieved according to different screening grades, and therefore, efficiency is higher; the pushing plate, the sorting guide parts and the transfer joint, which are arranged on each plate rack, are mutually matched, the transfer joint is connected to a transfer belt, the pushing plate is matched on the plate racks, and workpieces screened out by the sorting guide parts are timely fed out to process, so that existing mechanical hand clamping type is changed, graded sorting and batch feeding are realized, and efficiency is high.

Description

technical field [0001] The invention relates to the technical field of semiconductor processing equipment, in particular to a chip screening equipment. Background technique [0002] Chip is an abbreviation of integrated circuit. Chip refers to a small semiconductor chip inside the integrated circuit package, that is, there are many varieties of die chips, and with the development of science and technology, it continues to increase. Thousands of pieces, up to tens of thousands of pieces, in order to ensure the dimensional accuracy of the chip, a piece of chip needs to be fully inspected by testing equipment, and according to different dimensional tolerances, the product is divided into three grades: excellent, good, and poor. Currently, for chip screening The method adopted is to use electricity to detect the chip, and then use the manipulator to collect the tested chips in different containers according to the test results. With the large-scale trial production of 5G chips, ...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a chip screening device. The method used to solve the chip screening is to use power to detect chips, and then use the manipulator to collect the detected chips in different containers according to the detection results. With the 5G chip Large-scale trial production, the number of chips carried on the same chip test board has greatly increased. At present, the chip test boards divided according to different grades only use a single manipulator to grip the method, which is inefficient. If multiple chips are used on the same chip test board The technical problem that the robot is easy to collide when picking up parts

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