High vibration resistance electronic speckle interferometry system and method
An electronic speckle interferometry and measurement system technology, applied in the field of high vibration resistance electronic speckle interferometry systems, can solve the problems of slow measurement speed, speckle image phase difference deviation, inability to accurately measure displacement or displacement derivatives, and shorten the acquisition time. time, ensuring precise measurements, reducing sensitivity
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Embodiment 1
[0054] see Figure 1-2 , figure 1 It is a schematic structural diagram of a high-vibration-resistant electronic speckle interferometry system according to a preferred embodiment of the present invention; figure 2 It is a synchronous control schematic diagram of a high-speed camera and a piezoelectric ceramic phase shifter according to a preferred embodiment of the present invention. This highly vibration-resistant electronic speckle interferometry system includes:
[0055] Michelson interferometer, which includes a phase-shift mirror and a high-speed camera;
[0056] piezoelectric ceramics for moving the phase shift mirror back and forth;
[0057] a driver for driving the piezoelectric ceramic;
[0058] The controller is connected to the driver and the high-speed camera respectively, and is used to send a synchronous first signal and a second signal, the first signal is used to control the high-speed camera to take pictures, and the second signal is a sinusoidal voltage s...
Embodiment approach
[0063] According to yet another preferred embodiment of the present invention, said 4t is less than the period T of air disturbance or environmental vibration. It can be understood that this can reduce or prevent disturbance of the air or vibration of the environment from disturbing the measurement.
[0064] According to another preferred embodiment of the present invention, the 4t is less than T / 4, T / 8, T / 10, T / 20 or T / 30. Studies have shown that this can further prevent air turbulence and / or environmental vibration from interfering with the measurement, and at the same time, can relatively reduce the cost of the system.
[0065] According to another preferred embodiment of the present invention, the I A , I B , I C , I D The phase difference between the two is π / 2, expressed as follows:
[0066]
[0067]
[0068]
[0069]
[0070] Among them, I 0 is the background light intensity of the speckle pattern, μ is the amplitude of the modulated light intensity, ...
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