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A heavy ion irradiation system and irradiation method

A technology of ion irradiation and irradiation, applied in the field of heavy ion irradiation system and irradiation, can solve the problems of low test efficiency and achieve the effect of increasing the temperature dimension

Active Publication Date: 2022-05-17
INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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  • Application Information

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Problems solved by technology

[0003] However, at present, the heavy ion irradiation test generally uses a single sample to achieve a single dose, so the test efficiency is low. Therefore, it is necessary to propose a new heavy ion irradiation device in order to obtain samples with different irradiation doses efficiently and quickly, and improve the efficiency of the test. Efficiency and Effectiveness of Trials

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  • A heavy ion irradiation system and irradiation method
  • A heavy ion irradiation system and irradiation method
  • A heavy ion irradiation system and irradiation method

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Embodiment approach

[0036] According to an embodiment of the present invention, the transverse gradient dose control device includes a liquid nitrogen cooling / lifting / rotating sample stage, and the sample stage includes a lifting mechanism, a rotating mechanism, and a sample holder cooled by liquid nitrogen; It is used to efficiently absorb the radiant heat brought by the ion beam, so as to keep the sample test process always at a low temperature. The sample holder fixes the sample, and the lifting mechanism can drive the sample holder up and down, that is, to drive the sample to lift; the rotating mechanism can drive the sample holder to rotate along the axial direction, that is, to drive the sample to rotate. For example, samples can be fixed on four different faces of the quadrangular prism sample holder, and the sample that needs to be irradiated can be rotated to that face. The ability to rotate increases the number of samples that can be mounted at one time. Both the lifting mechanism and ...

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Abstract

The invention relates to an ion irradiation system and method. The system includes a vacuum chamber and a transverse gradient dose control device, wherein the vacuum chamber is provided with an ion beam entrance; one end of the transverse gradient dose control device extends into the vacuum chamber, and the one end is used for The sample to be irradiated is fixed, the axis of the transverse gradient dose control device is perpendicular to the incident direction of the ion beam, and the transverse gradient dose control device can move along its axial direction. The method of the present invention using heavy ion irradiation can form a continuous gradient dose damage area on the material, and obtain a sample with a damage distribution similar to that of neutron irradiation in a short period of time, providing a basis for the screening of candidate materials for advanced nuclear energy systems and service life assessment. the experimental platform.

Description

technical field [0001] The invention relates to the technical field of heavy ion irradiation high-throughput evaluation, in particular to a heavy ion irradiation system and an irradiation method. Background technique [0002] In the internal structural components of nuclear reactors, due to elastic collisions caused by neutron irradiation or low-energy recoil nuclei caused by alpha decay, certain damages will be caused to materials. For the simulation of this kind of damage, the ideal experiment is fast neutron irradiation. However, the neutron irradiation damage cross section is small, the irradiation period is long, and the efficiency of data generation is low, which affects the timeliness of reactor life assessment. Because heavy ions have a displacement damage cross-section that is 2-3 orders of magnitude higher than that of neutrons, heavy ion irradiation experiments greatly improve the efficiency of the test and reduce the cost of the test, and have been used to simul...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G21K5/10G21K5/04G21C17/00
CPCG21K5/10G21K5/04G21C17/001Y02E30/30
Inventor 张崇宏
Owner INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI