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Screening method of solid-state capacitor

A screening method and capacitor technology, applied in the direction of instruments, measuring electricity, measuring electrical variables, etc., can solve the problems of no poor capacity, hidden quality problems, failure of the whole machine, and reduce the risk and characteristics of defective products flowing out to the customer. The effect of stabilizing and stabilizing LC characteristics

Active Publication Date: 2020-09-18
ZHAOQING BERYL ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The solid capacitor of the dispersion liquid system has many advantages, such as: good high temperature resistance, high working voltage, etc., but there are also disadvantages, and its batches of products will produce about 0.01%~0.03% of no capacity defects, and it is difficult to sort It is completely eliminated in the process of processing, which brings great hidden dangers to the quality. Since direct sorting cannot remove the defective products, the products will flow out to the client, and the client may show no capacity defects, and eventually the client will fail.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0017] A screening method for a solid capacitor, the solid capacitor is a solid capacitor impregnated with a conductive dispersion. The screening method comprises the following steps:

[0018] (11) Conduct a short-term high-temperature load damage test on the good products after aging and sorting.

[0019] Specifically, after the normal automatic aging and sorting of this batch of solid capacitors, the sorted good products are serially arranged into the racks and put into the oven. Connect each capacitor to the power supply, apply the rated working voltage, and conduct a short-term 24h high-temperature load destruction test at 105°C.

[0020] (12) Discharging and cooling the solid capacitor in step (11).

[0021] Specifically, after the high-temperature load destruction test is completed, the solid capacitor product is discharged with a discharge resistor until the voltage across the test resistor is 0V, and then removed from the shelf to complete the discharge treatment; th...

Embodiment 2

[0026] A screening method for a solid capacitor, the solid capacitor is a solid capacitor impregnated with a conductive dispersion. The screening method comprises the following steps:

[0027] (11) Conduct a short-term high-temperature load damage test on the good products after aging and sorting.

[0028] Specifically, after the normal automatic aging and sorting of this batch of solid capacitors, the sorted good products are serially arranged into the racks and put into the oven. Connect each capacitor to the power supply, apply the rated working voltage, and conduct a short-term 4h high-temperature load destruction test at 125°C.

[0029] (12) Discharging and cooling the solid capacitor in step (11).

[0030] Specifically, after the high-temperature load destruction test is completed, the solid capacitor product is discharged with a discharge resistor until the voltage across the test resistor is 0V, and then removed from the shelf to complete the discharge treatment; the...

Embodiment 3

[0035] A screening method for a solid capacitor, the solid capacitor is a solid capacitor impregnated with a conductive dispersion. The screening method comprises the following steps:

[0036] (11) Conduct a short-term high-temperature load damage test on the good products after aging and sorting.

[0037] Specifically, after the normal automatic aging and sorting of this batch of solid capacitors, the sorted good products are serially arranged into the racks and put into the oven. Connect each capacitor to the power supply, apply the rated working voltage, and conduct a short-term 12h high-temperature load destruction test at 130°C.

[0038] (12) Discharging and cooling the solid capacitor in step (11).

[0039] Specifically, after the high-temperature load destruction test is completed, the solid capacitor product is discharged with a discharge resistor until the voltage across the test resistor is 0V, and then removed from the shelf to complete the discharge treatment; th...

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PUM

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Abstract

The invention discloses a screening method of a solid-state capacitor. The method comprises the following steps of: performing a short-time high-temperature load damage test on an aged and sorted goodproduct, and then performing discharge treatment and low-temperature cooling treatment; then carrying out sorting, and if there is no capacity abnormity in knockout product analysis in the sorting process, determining the batch to be a real good product; and if there is , repeating the above steps. According to the invention, after normal full-automatic aging sorting, a short-time high-temperature reliability test is carried out on 100% of good products, defective products are destroyed, then discharge and low-temperature cooling treatment are carried out, finally sorting judgment is carriedout, and defective products are removed.

Description

technical field [0001] The invention relates to the technical field of capacitor manufacturing, in particular to a screening method for solid capacitors. Background technique [0002] At present, in the manufacturing process of the solid capacitor of the dispersion liquid system, except for the impregnation method, the rest of the process is the same as the production method of the traditional capacitor. The solid capacitor of the dispersion liquid system has many advantages, such as: good high temperature resistance, high working voltage, etc., but there are also disadvantages, and its batches of products will produce about 0.01%~0.03% of no capacity defects, and it is difficult to sort It is completely eliminated in the process of processing, which brings great hidden dangers to the quality. Since the direct sorting cannot remove the defective products, the products will flow out to the client, and the client may show no capacity defects, and eventually the client will fai...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01G01R31/00
CPCG01R31/016G01R31/003Y02E60/13
Inventor 何东石伍小军刘泳澎
Owner ZHAOQING BERYL ELECTRONICS TECH
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