Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multispectral optical axis parallelism test device and test method

A test device and multi-spectrum technology, which is applied in the field of optical detection, can solve the problems that cannot satisfy the optical axis test of multi-spectral photoelectric equipment, and achieve the effect of high-precision testing, high testing efficiency and stable performance

Active Publication Date: 2021-05-14
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the current optical axis parallelism test device cannot satisfy the test problem of the optical axis parallelism of each optical sub-system of multi-spectral optoelectronic equipment, the present invention proposes a multi-spectral optical axis parallelism test device and testing method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multispectral optical axis parallelism test device and test method
  • Multispectral optical axis parallelism test device and test method
  • Multispectral optical axis parallelism test device and test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0085] The present invention will be further described below in conjunction with accompanying drawing.

[0086] Such as figure 1 As shown, the multi-spectral optical axis parallelism test device provided by the present invention includes a wide-spectrum target alignment module, a multi-spectral target generation module, a laser spot acquisition module, an image analysis module and a reference mirror 10 .

[0087] The multi-spectral target generation module is used to simulate targets of different spectral bands, including the first attenuation film 4, the laser light source 5, the target target 6, the wide-spectrum light source 7 and the second beam splitter 3, wherein: the first attenuation film 4 is set On the output light path of the laser light source 5, the first attenuation plate 4 and the laser light source 5 are used to simulate the laser ranging band target; the target target 6 is arranged on the output light path of the wide-spectrum light source 7, and the target ta...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

In order to solve the problem that the current optical axis parallelism test device cannot satisfy the test problem of optical axis parallelism of each optical sub-system of multi-spectral photoelectric equipment, the present invention proposes a multi-spectral optical axis parallelism test device and a test method. The present invention uses off-axis parabolic mirrors, beam splitters, short-wave infrared cameras, wide-spectrum light sources, target targets and laser light sources to realize the simulation of wide-spectrum infinite targets. According to the imaging position of the simulated target in each optical subsystem, The parameters of each optical subsystem and the focal length of the collimator, and the calculation of the consistency of the optical axis between the optical subsystems, can complete the visible light imaging system, infrared imaging system, laser emitting system, laser receiving system, visual inspection system in multi-spectral photoelectric equipment. The test of the parallelism of the optical axis between the aiming system and the mechanical reference of the equipment can realize all the requirements of the optical axis consistency of the current optoelectronic equipment.

Description

technical field [0001] The invention belongs to the technical field of optical detection, and relates to a testing device for parallelism between the aiming lines (visual axes) of multi-spectral optical subsystems of a photoelectric tracking instrument, and between each optical subsystem of the instrument and an installation mechanical reference. method. Background technique [0002] At present, multi-optical sensor optoelectronic devices integrating visible light imaging, low-light imaging, infrared thermal imaging, laser ranging, and visual aiming are widely used in security monitoring, forest fire prevention and other fields. Tasks such as tracking, observation and targeting, azimuth indication, and all-weather imaging have significantly improved the overall performance and efficiency of optoelectronic equipment. Multi-spectral photoelectric equipment refers to the integration of two or more of visible light cameras, low-light cameras, mid-wave infrared thermal imaging c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/0207G01M11/0257
Inventor 田留德周艳王涛赵建科曹昆
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com