Random walk parasitic capacitance parameter extraction method based on FPGA and CPU heterogeneous calculation
A random walk algorithm and random walk technology, applied in computer, computer-aided design, digital computer components, etc., can solve problems such as limited FPGA chip resources and weak circuit control capabilities
Pending Publication Date: 2020-10-20
FUDAN UNIV
0 Cites 2 Cited by
AI-Extracted Technical Summary
Problems solved by technology
View more
Abstract
The invention belongs to the field of integrated circuits, and particularly relates to a random walk parasitic capacitance parameter extraction method based on FPGA and CPU heterogeneous computing. The method comprises: after a GDS layout is read in a CPU, a Gaussian plane is generated, initial points are generated, the layout is segmented and blocks are screened, operating a random walk algorithmin an FPGA for each block containing the initial points; and completing a path which exceeds a block boundary or does not touch any conductor in the FPGA in the CPU, and calculating a final parasiticcapacitance result. The method is simple and regular in algorithm, does not need a complex space management strategy, still has a relatively high energy efficiency ratio, can be repeatedly used for different GDS layouts after the FPGA bit streams for processing the blocks are generated through one-time compiling, and is high in practicability. The invention particularly provides an FPGA and CPU heterogeneous computing framework suitable for random walk parasitic capacitance parameter extraction. And a layout segmentation method and an optimization method for improving the FPGA code parallel efficiency are provided for the framework.
Application Domain
Computer aided designEnergy efficient computing +2
Technology Topic
Integrated circuitHigh energy +4
Image
Examples
- Experimental program(1)
Example Embodiment
PUM


Description & Claims & Application Information
We can also present the details of the Description, Claims and Application information to help users get a comprehensive understanding of the technical details of the patent, such as background art, summary of invention, brief description of drawings, description of embodiments, and other original content. On the other hand, users can also determine the specific scope of protection of the technology through the list of claims; as well as understand the changes in the life cycle of the technology with the presentation of the patent timeline. Login to view more.