X-ray diffractometer simulation device and using method thereof
A simulation device, diffractometer technology, applied in the direction of measuring device, material analysis using wave/particle radiation, instruments, etc., can solve the problem that students are difficult to get intuitive understanding
Pending Publication Date: 2020-12-04
深圳市美信检测技术股份有限公司
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In daily teaching and training, when teachers explain the principle of X-ray diffraction analysis and the principle of diffractometer, it is difficult for students to get an intuitive understanding due to the relatively complicated and profound theories.
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[0027] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.
[0028] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...
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The invention discloses an X-ray diffractometer simulation device and a using method thereof, and relates to the technical field of material science characterization method demonstration instruments.The X-ray diffractometer simulation device comprises a base, a light source, a sample simulator and a light receiving device. A plurality of reflectors are arranged on the outer wall of the sample simulator and correspond to diffracted crystal faces of the sample simulator in a one-to-one mode, the sample simulator is rotationally connected with the base through a rotating shaft, the light source,the light receiving device and the rotating shaft are arranged on the same plane, and the sample simulator is arranged between the light source and the light receiving device. The light source and the light receiving device can rotate oppositely or reversely around the sample simulator with the same preset radius, light beams emitted by the light source can be used for irradiating the reflector so that the light beams can be reflected to the light receiving device through the reflector, and the light receiving device is used for displaying intensity information of reflected light. The X-ray diffractometer simulation device is helpful for teachers and students to learn a method of an X-ray diffraction technology and a principle of a powder diffractometer through abstract and profound theories.
Description
technical field [0001] The invention relates to the technical field of demonstration instruments for material science characterization methods, in particular to an X-ray diffractometer simulation device and a use method thereof. Background technique [0002] X-ray diffraction analysis technique (X-ray diffraction, XRD) is an important technique for analyzing the phase of solid crystal materials. The diffraction data produced by each crystal can reflect the atomic arrangement inside the crystal. Therefore, the X-ray diffraction pattern is also considered to be the "fingerprint" of a particular crystalline material. It can obtain various useful information such as the crystal structure, composition, stress, orientation, crystallinity, etc. . As an important testing method and structural analysis method, X-ray diffraction analysis technology has been used in various fields. [0003] The diffraction of X-ray diffraction on the crystal plane must first meet the Bragg diffract...
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IPC IPC(8): G09B23/22G01N23/207G01N23/20008
CPCG09B23/22G01N23/2076G01N23/20008G01N2223/056G01N2223/1016
Inventor 张伟许佳佳邓伟彭璟樊申腾
Owner 深圳市美信检测技术股份有限公司