Word line and bit line voltage conversion method and circuit and NAND flash memory

A technology of voltage conversion and conversion circuit, applied in the field of circuit and non-type flash memory, word line bit line voltage conversion method, can solve the problems of waste of electric charge, uncertainty of charging and discharging time, reliability of high-voltage devices, etc., to avoid reliable The effect of avoiding charge and discharge time uncertainty, avoiding charge waste

Inactive Publication Date: 2020-12-15
XTX TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a word line bit line voltage conversion method, circuit and non-type flash memory, aiming to solve the problem of reliability of high-voltage devices when the existing non-type flash memory performs address switching under high voltage, and the traditional low bias The problem of charge waste and uncertainty of charge and discharge time caused by repeated charging / discharging of capacitors on word lines or bit lines

Method used

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  • Word line and bit line voltage conversion method and circuit and NAND flash memory
  • Word line and bit line voltage conversion method and circuit and NAND flash memory
  • Word line and bit line voltage conversion method and circuit and NAND flash memory

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Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of the present application.

[0026] It should ...

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Abstract

The invention discloses a word line and bit line voltage conversion method, a word line and bit line voltage conversion circuit and a NOR flash memory. When an NOR FLASH needs to execute a certain operation and a corresponding word line or bit line needs to be biased to a high voltage, a charge pump provides a power supply voltage for the word line or bit line; when the NOR FLASH needs to switch the address of a word line or a bit line and the voltage of the current word line or bit line needs to be biased to a voltage lower than the current voltage, a stable voltage generation module providesa power supply voltage for the word line or bit line; a lower power supply voltage is provided for a word line or a bit line through the stable voltage generation module, so that the NAND flash memory can carry out safe address switching under a lower voltage, and the reliability problem generated by a high-voltage device is avoided; a lower power supply voltage is directly provided for a word line or a bit line through the stable voltage generation module, so that the problems of charge waste and charging and discharging time uncertainty caused by repeated charging / discharging of a capacitoron the word line or the bit line when the low voltage is biased traditionally are solved.

Description

technical field [0001] The invention relates to the technical field of non-type flash memory, in particular to a word line bit line voltage conversion method, circuit and non-type flash memory. Background technique [0002] NOR FLASH requires different high-voltage biases for word lines / bit lines / substrates during read / write / erase operations. figure 1 Some basic bias voltage requirements for operation are listed. With 2 as the basic NOR FLASH architecture. [0003] 1. Take the write operation as an example, because the bit line / word line of NOR FLASH needs a high-voltage bias during the write operation, so the corresponding bit / word line decoding and driving circuits are composed of high-voltage devices. When doing write operation and write detection operation, it is necessary to switch the bit / word line address continuously, so these decoding and driving circuits also need to switch continuously. The mainstream high-voltage device of NOR FLASH is a 5V device, so the switc...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G11C16/30G11C5/14G11C16/12G11C16/08G11C16/24
CPCG11C5/147G11C16/08G11C16/12G11C16/24G11C16/30
Inventor陈纬荣冯鹏亮陈慧
OwnerXTX TECH INC