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Fast and high-precision phase recovery method for anti-vibration interferometry

An interferometric measurement and phase recovery technology, which is applied to measurement devices, optical devices, instruments, etc., can solve problems such as easy to fall into local optimal solutions, mathematical approximation errors, etc., and achieves improved robustness, less computation, and high recovery. The effect of precision

Active Publication Date: 2022-03-18
NANJING UNIV OF SCI & TECH
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Problems solved by technology

However, most of the existing iterative methods use the mathematical approximation of the first-order Taylor expansion to establish the linear least squares iterative model, or use the nonlinear least squares method to iterate. This kind of iterative method has mathematical approximation errors and is easy to fall into local optimum. solution, resulting in the interferogram that can only handle small vibration tilt amplitudes

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  • Fast and high-precision phase recovery method for anti-vibration interferometry
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  • Fast and high-precision phase recovery method for anti-vibration interferometry

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[0019] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0020] In one embodiment, combined with figure 1 , providing a fast and high-precision phase recovery method for anti-vibration interferometry, said method comprising the following steps:

[0021] Step 1, for each interferogram I n (x, y), respectively extract the i-th row and j-th column data, and obtain two sets of one-dimensional interference signals I n (x,i) and I n (j,y);

[0022] Step 2, constructing an alternate iterative optimization model of phase distribution and tilt parameters for the one-dimensional interference signal;

[0023] Step 3, calculating the i...

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Abstract

The invention discloses a fast and high-precision phase recovery method for anti-vibration interferometry, comprising: taking a certain row and a certain column of data in an interferogram to obtain two sets of one-dimensional interference signals; Optimization model; calculate the initial value of the tilt parameter of the one-dimensional interference signal; use the alternate iteration optimization model to alternately iterate the one-dimensional interference signal to obtain the corresponding tilt parameter of the one-dimensional interference signal; calculate the original two-dimensional interferogram according to the one-dimensional tilt parameter. The tilt parameter of the vibrating tilted plane; the phase information of the original interferogram is solved by the least squares solution phase method. The present invention has high phase recovery accuracy and fast iterative convergence speed for the conditions of large vibration inclination amplitude, small number of fringes, closed fringes and non-closed fringes, and non-uniform background and modulation degree, and does not require hardware for the interferometric measurement system. The modification provides a low-cost, high-precision solution for phase-shifting interferometry in vibration environments.

Description

technical field [0001] The invention belongs to the field of optical interferometric measurement, in particular to a fast and high-precision phase recovery method for anti-vibration interferometric measurement. Background technique [0002] Nowadays, optical interferometry technology is widely used to measure the surface shape of optical components, and phase-shifting interferometry technology has become the most important measurement method in interferometry due to its high precision. During phase-shift interferometry, a phase shifter is usually used to generate a phase shift of 2π / N between interferograms, where N is greater than or equal to 3. However, in actual measurement, the vibration of the external environment will cause random tilt errors in the phase shift amount, resulting in different phase shift amounts at different positions in the same interferogram, thereby reducing the accuracy of the measurement results. [0003] In order to recover the measured phase fro...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/2441
Inventor 李建欣段明亮宗毅
Owner NANJING UNIV OF SCI & TECH
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