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A signal bandwidth test circuit for communication devices

A technology of signal bandwidth and test circuit, which is applied in the field of finished product testing of electronic components

Active Publication Date: 2022-05-03
英彼森半导体(珠海)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the cost of chip testing is strongly related to the cost of the machine

Method used

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  • A signal bandwidth test circuit for communication devices
  • A signal bandwidth test circuit for communication devices
  • A signal bandwidth test circuit for communication devices

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Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] like figure 1 As shown, the embodiment of the present invention discloses a signal bandwidth test circuit of a communication device, which is built on a test machine of the device under test, including: a filter circuit and a comparator circuit; the input terminal of the device under test and the filter circuit The output terminal is connected, and the output terminal is connected with the input terminal of the comparator circuit;

[0027] The input en...

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Abstract

The invention discloses a signal bandwidth testing circuit for communication devices, comprising: a filter circuit and a comparator circuit; the device to be tested is connected to the filter circuit and the comparator circuit respectively; the input end of the filter circuit is connected to a test machine of the device to be tested The digital board connection on the board is used to receive the square wave signal generated by the digital board and convert the square wave signal into a sine wave signal; the device under test receives the sine wave signal and outputs a level signal of corresponding amplitude according to the sine wave signal ; The comparator circuit receives the level signal output by the device under test, and compares the amplitude of the level signal output by the device under test with a preset threshold, and if it is less than the preset threshold, it is judged that the bandwidth of the device under test does not meet the requirements. The invention converts the square wave output by the digital board on the test machine into a sine wave, which can reduce the sampling rate of the signal bandwidth frequency of the test machine, and greatly reduce the test cost of the chip on the premise of meeting the same test requirements.

Description

technical field [0001] The invention relates to the technical field of finished product testing of electronic components, in particular to a signal bandwidth testing circuit for communication devices. Background technique [0002] In the quality control of semiconductor integrated circuits, chip finished product testing is the last link of quality control, its role is very critical, and it is also an important part of the product cost structure. In this link, the cost of chip testing is positively related to the cost of the test machine. If the cost of the machine is high, the charge per unit time will be higher. Therefore, on the premise of ensuring that defective products are effectively filtered out, the test rate per unit time should be increased. Efficiency, or using lower-end machines to complete product testing with high quality, has become the most effective means to improve the cost of chip testing. [0003] In the integrated circuit product test, if the device und...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L43/08H04L43/50
CPCH04L43/08H04L43/50
Inventor 王定斌汤昊林邹亮唐聪
Owner 英彼森半导体(珠海)有限公司