System-level integrated circuit DC voltage drop parallel analysis method and system
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 北京智芯仿真科技有限公司
- Publication Date
- 2021-01-29
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Abstract
Description
technical field
[0001] The invention relates to the technical field of system-level integrated circuit analysis, in particular to a parallel analysis method and system for system-level integrated circuit DC voltage drop. Background technique
[0002] The DC voltage drop analysis of system-level VLSI is an important task in the back-end verification of integrated circuits. In the design process of the current system-level VLSI, the core power supply voltage of the devices in the integrated circuit continues to decrease, and the tolerance of the allowable voltage is getting smaller and smaller, but the operating current and wiring density of the integrated circuit are getting larger and larger. As a result, the DC voltage drop problem has become increasingly prominent. If the DC voltage drop problem is not considered in the design process of the system-level VLSI, it is likely that the noise margin of the system will decrease due to the DC voltage drop problem, and a small di...