Substrate defect inspection device and method
A defect inspection and substrate technology, which is applied in the field of defect devices, can solve the problems of PCB manufacturing yield reduction, emotional errors, and identification of unqualified PCBs, and achieve the effect of improving yield and maintaining consistency
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[0034] Hereinafter, each embodiment will be described in detail with reference to the drawings. The embodiments described below can be modified and implemented in various forms. In order to more clearly describe the features of each embodiment, detailed descriptions of matters known to those of ordinary skill in the art to which each embodiment pertains below are omitted. In addition, in the drawings, parts irrelevant to the description of the respective embodiments are omitted, and similar reference numerals are assigned to similar parts throughout the specification.
[0035] Throughout the specification, when a certain structure is "connected" to another structure, this includes not only the case of "directly connected" but also the case of "connected with other structures interposed therebetween". In addition, when a certain structure "includes" a certain structure, unless otherwise specified, it means that other structures may also be included rather than excluding other ...
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