PCB through hole tin layer thickness device and electrochemical timing coulometry testing method thereof
A technology of layer thickness and through-hole tin, which is applied in the field of PCB through-hole tin layer thickness equipment and its electrochemical chronoelectric method test, can solve the problems of large measurement error, long test time, cumbersome operation, etc., and achieve small measurement data error , short measurement time and simple operation
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[0029] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0030] see Figure 1 to Figure 2 , the present invention provides a PCB through-hole tin layer thickness device and its electrochemical chrono-coulometric test method technical scheme: a PCB through-hole tin layer thickness device and its electrochemical chrono-coulometric test method, including solution 1, solution tank 2. The PCB board to be tested 5, the auxiliary electrode 6, the electrochemical workstation 7, the reference electrode 9 and the pressure-sen...
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