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A structure of shielded gate-trench type mosfet and its manufacturing method

A trench-type, shielded gate technology, used in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as large breakdown voltage, limiting MOSFET device application, and increasing specific on-resistance, reducing manufacturing Cost, good uniformity and stability, the effect of improving production efficiency

Active Publication Date: 2022-04-08
江苏长晶科技股份有限公司
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  • Claims
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Problems solved by technology

From the above relationship between breakdown voltage and specific on-resistance, it can be seen that if the device can be used in high voltage, a larger breakdown voltage is required. At this time, the specific on-resistance will rise sharply, which will limit some The application of MOSFET devices in high-voltage power integrated circuits, especially in circuits requiring low conduction loss and small chip area

Method used

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  • A structure of shielded gate-trench type mosfet and its manufacturing method
  • A structure of shielded gate-trench type mosfet and its manufacturing method
  • A structure of shielded gate-trench type mosfet and its manufacturing method

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[0023] The technical means adopted by the present invention to achieve the intended invention purpose are further described below in conjunction with the drawings and preferred embodiments of the present invention. In the various figures, identical elements are indicated with similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale. Also, some well-known parts may not be shown. For the sake of simplicity, the semiconductor structure obtained after several steps can be described in one figure.

[0024] It should be understood that when describing the structure of a device, when a layer or a region is referred to as being “on” or “over” another layer or another region, it may mean being directly on another layer or another region, or Other layers or regions are also included between it and another layer or another region. Also, if the device is turned over, the layer, one region, will be "below" or "beneath" the other lay...

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Abstract

The invention discloses a shielded gate-groove MOSFET structure and a manufacturing method thereof. The shielded gate-trench MOSFET in the present invention adopts a stepped gate oxide to form a gate dielectric layer, and the stepped gate dielectric layer is an n-level oxide, and the thickness of the oxide from the bottom of the trench to the top of the trench is D1 , D2,..., Dn, wherein, D1>D2>...>Dn. The shielded gate-trench MOSFET structure using the stepped gate oxide as the gate dielectric layer disclosed in the present invention can effectively realize the isolation between the gate and the drain, reduce the gate-to-drain capacitance Cgd, and also make the The MOSFET has a lower specific on-resistance and maintains a high breakdown voltage, which improves the performance of the MOSFET.

Description

technical field [0001] The invention relates to semiconductor technology, and more specifically, to a structure and a manufacturing method of a shielded gate-trench MOSFET. Background technique [0002] Metal-Oxide-Semiconductor Field-Effect Transistors, referred to as Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are widely used in switching components of power devices, such as power supplies, rectifiers or low-voltage motors controller etc. Existing MOSFETs mostly adopt a vertical structure design, such as trench MOSFETs, to increase device density. Shielded gate metal oxide semiconductor field effect transistors are commonly used in the industry to improve the excessively high gate-drain capacitance in the existing trench MOSFET structure, increase the cut-off voltage of the transistor, and reduce switching losses. [0003] Operating loss is one of the most important performance parameters of power devices. Operating loss mainly includes three aspects: co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/423H01L29/786H01L21/336
CPCH01L29/4236H01L29/42368H01L29/42384H01L29/66742H01L29/78606H01L2029/42388H01L29/7813H01L29/407
Inventor 杨国江于世珩张胜凯白宗纬
Owner 江苏长晶科技股份有限公司
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