Clock fault detector

Abstract

The invention discloses a clock fault detector, and the detector comprises a time sequence control signal generator and a clock fault detection module which can respectively generate a control signal according to a clock signal and perform clock fault detection according to the control signal respectively. The clock fault detection module may include a first integrator, a sample hold circuit, a second integrator, and a comparator. The first integrator can convert previous clock periods of the clock signals into reference voltages according to ping-pong mode control signals in the control signals. The sampling and holding circuit can sample and hold the reference voltage according to the ping-pong mode control signal; the second integrator can convert the current clock period of the clock signal into a ramp signal; and the comparator can compare the ramp signal with at least one reference voltage to generate a comparison result signal for indicating whether the clock signal is normal or not. Compared with a traditional architecture, the clock fault detector has higher precision in process, and can enable the electronic device to achieve optimized efficiency.

Description

technical field [0001] The present invention relates to electronic circuits, in particular to a clock fail detector. Background technique [0002] Clock failure detectors are important fundamental circuits in electronic devices. Conventional clock failure detectors have certain problems. In particular, their response time (e.g., the delay time of a pulse representing a clock failure relative to the point in time at which the clock failure occurs) is typically constant and independent of the input clock period, which can be Inconvenience for mishandling of electronic devices. For example, the above response time cannot be shortened as the input clock becomes faster. As another example, the above response time cannot be increased as the input clock becomes slower. Furthermore, the aforementioned response times are typically sensitive to process variations, which can cause inaccuracies in the operation of electronic devices, degrading overall performance. Therefore, a novel...

AI Technical Summary

Problems solved by technology

Conventional clock failure detectors have certain problems. In particular, their response time (e.g., the delay time of a pulse representing a clock failure relative to the point in time at which the clock failure occurs) is typically constant and independent of the input clock period, which can be Inconvenience for incorrect disposal of electronic devices

For example, the above response time cannot be shortened as the input clock becomes faster

As another example, the above response time cannot be increased as the input clock becomes slower

In addition, the aforementioned response times are typically sensitive to process variations, which can cause inaccuracies in the operation of electronic devices, degrading overall performance

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