Method and system for classifying defective radio frequency front-end module chips in mass production

A radio frequency front-end, classification method technology, applied in character and pattern recognition, special data processing applications, instruments, etc., can solve problems such as risk failure sampling, affecting product delivery quality, etc., to optimize work efficiency and improve delivery quality. , the effect of improving the detection rate

Pending Publication Date: 2021-05-25
RF360 TECH (WUXI) CO LTD
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Problems solved by technology

[0004] In order to solve the problem that the existing mass-produced chip defect classification method cannot sample risk failures from a large number of non-true defects (NTF) and non-risk failures, which affects the quality of product shipments, the present invention provides a radio frequency front-end module quantity The classification method of defective chips can be classified according to the test data of defective products, so as to control and analyze classes of different risk levels, improve the detection rate of risk failure, and then improve the quality of product shipments

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  • Method and system for classifying defective radio frequency front-end module chips in mass production
  • Method and system for classifying defective radio frequency front-end module chips in mass production
  • Method and system for classifying defective radio frequency front-end module chips in mass production

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Embodiment Construction

[0032] A method for classifying defective chips produced in mass production of radio frequency front-end modules, comprising:

[0033] Step 1. computer collects the historical test data of defective product; Described historical test data comprises: product model, the frequency band of described product model and the failure mode under each frequency band, the insertion loss corresponding to described failure mode and gain test item, all The test values ​​of the above insertion loss and gain test items;

[0034] Step 2. The computer sets the first basic classification value L1B and the second basic classification value L2B according to the distribution of failure modes and insertion loss and gain test values ​​of the same frequency band B of all product models, so that 100% of the high-risk failure modes correspond to The test value is between L1B and L2B, at least 72% of the test values ​​corresponding to the medium risk failure mode are between L1B and L2B, at least 70% of t...

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Abstract

The invention provides a method and system for classifying defective radio frequency front-end module chips in mass production, which can perform classification according to test data of defective products, thereby performing management and control analysis on classes of different risk levels, improving the detection rate of risk failure, and further improving the quality of the products.

Description

technical field [0001] The invention belongs to the technical field of failed chip classification, and in particular relates to a method and system for classifying defective chips produced in mass production of radio frequency front-end modules. Background technique [0002] With the advent of the 5G era, the market demand for RF front-end modules has been stimulated. The high efficiency, compactness and low cost of RF front-end modules have made them widely used in the wireless communication industry. Manufacturing and producing high-quality products in large quantities is the core competitiveness of an enterprise. On the premise of improving the level of design and manufacturing technology, improving the detection rate of risk failures, discovering problems in time, solving problems, and improving the quality of shipments are also important for manufacturing and production. It plays a vital role in producing large quantities of high-quality products. [0003] In the prior...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06F30/20G06F119/02
CPCG06F30/20G06F2119/02G06F18/24
Inventor 陈曦郝晓卿曹萍焦智芬
Owner RF360 TECH (WUXI) CO LTD
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