Gene detection kit of endometriosis Pap smear sample and method for judging deterioration degree of endometriosis
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SUN YAT SEN UNIV
- Publication Date
- 2021-06-25
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Abstract
Description
technical field
[0001] The invention relates to a gene detection kit and its application, in particular to a gene detection kit for in vitro detection of endometriosis Pap smear samples and its use in non-invasive qualitative judgment of endometriosis method of deterioration. Background technique
[0002] Endometriosis is a benign but debilitating gynecological disorder associated with chronic pelvic pain, dysmenorrhea, and infertility. About 10% of women of reproductive age are affected by endometriosis, which causes abnormal growth of endometrium-like tissues outside the uterine cavity. These growths on the benign peritoneal surface invade ectopically, mimicking the development of malignant metastases, and are accompanied by angiogenesis and cell migration. Histopathological observation and gene analysis showed that both endometrioid ovarian cancer and clear cell ovarian cancer were derived from endometriosis. Although some hypotheses have been put forward about the eti...