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A sample acquisition and fast labeling method with relatively fixed target state

A target state and sample technology, applied in image analysis, image enhancement, instruments, etc., can solve the problems of time-consuming and laborious manual labeling, difficult sample collection, and easy interference, and achieve the effect of reducing manual processing costs.

Active Publication Date: 2022-07-22
NR ELECTRIC CO LTD +1
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  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Image recognition technology based on artificial intelligence deep learning is developing rapidly, and has penetrated into various fields such as industry and residential life. Image recognition applications include classification, detection, segmentation, text recognition and other scenarios, in which classification and detection often rely on a large number of samples. Acquisition and accurate labeling of abnormal samples, but at present, image recognition has pain points such as small samples, uneven samples, susceptibility to interference, difficult sample collection, long sample labeling processing cycle, large environmental impact, and poor interpretability.
At present, the algorithm of image recognition is relatively mature, and the research direction is focused on parameter optimization, model acceleration, scheme design, etc. In addition, the recognition effect of image recognition basically depends on the training of a large number of accurately labeled samples in different environments. Existing labeling tools Although there are many open source projects including LabelImg, Labelme, RectLabel, etc., manual labeling is time-consuming and labor-intensive without exception. For scenes with complex environments, thousands of image labels and continuous iterative test scenarios are often required. Manual labeling is seriously restricted. With the effective development of image recognition work, if a large number of samples can be quickly obtained and accurate annotation can be completed quickly, it will greatly improve the research progress and engineering implementation efficiency in the field of image recognition

Method used

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  • A sample acquisition and fast labeling method with relatively fixed target state
  • A sample acquisition and fast labeling method with relatively fixed target state

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Embodiment example

[0041] Taking the state recognition scene of outdoor AIS switch in a substation in the power industry as an example, assuming that each switch only needs to identify the two states of the switch in position and closed, the following shows how to obtain a large number of AIS switch samples and quickly mark them. The on-site inspection of the substation includes the number and types of knife switches. All the targets to be identified and their different states are divided into several identification categories. The cameras are reasonably selected and the installation positions are arranged. Through the networking, all cameras can be accessed by the picture acquisition equipment.

[0042] According to the shooting state of the target in the camera, or actually adjust the physical position and angle of the camera, or change the preset position of the camera PTZ, finally all target knife gates (including the potential split state or closing position of the knife gate) can be clearly ...

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Abstract

The invention discloses a sample acquisition and fast labeling method with a relatively fixed target state, comprising the following steps: firstly, arranging cameras for shooting the target; secondly, a picture acquisition device is communicated and connected with each camera, and obtains pictures taken by each camera; , the picture acquisition device configures all target information, camera information, associated targets and cameras and camera preset position information; then, the picture acquisition device starts the automatic capture tool to generate sample pictures and pre-labeled files; finally, manually check the automatically captured sample pictures , batch secondary labeling of pictures whose target state has changed, and finally complete sample collection and rapid labeling. The invention solves the problems of difficulty in sample collection and time-consuming and laborious sample labeling in sample training in the field of deep learning image recognition, can quickly acquire and label samples, and greatly improves the efficiency of image recognition research or engineering implementation.

Description

technical field [0001] The invention relates to the field of artificial intelligence deep learning, in particular to a sample acquisition and rapid labeling method with a relatively fixed target state. Background technique [0002] Image recognition technology based on artificial intelligence deep learning is developing rapidly, and has penetrated into various fields such as industry and residential life. Image recognition applications include classification, detection, segmentation, text recognition and other scenarios, in which classification and detection often rely on a large number of samples, especially Acquiring and accurately labeling abnormal samples, but at present, image recognition has such pain points as small samples, uneven samples, easy interference, difficult sample collection, long sample labeling processing cycle, great environmental impact, and poor interpretability. At present, the algorithm of image recognition is relatively mature, and the research dir...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/30204
Inventor 刘中泽陈桂友程立朱何荣曾凯杜国斌刘东超须雷崔龙飞杨瑞
Owner NR ELECTRIC CO LTD
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