Unlock instant, AI-driven research and patent intelligence for your innovation.

Power-on self-test method and power-on self-test device

A technology of self-inspection and test results, applied in the direction of instruments, static indicators, etc., can solve problems such as hardware circuit abnormality, fault cause finding, analysis and troubleshooting, and users cannot know that the work is in a normal state, so as to reduce work abnormalities , the effect of reducing difficulty

Pending Publication Date: 2021-07-23
XIAN NOVASTAR TECH
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Usually, after the display controller is powered on, the microcontroller directly loads the main program of the programmable logic device, and then when the main program of the programmable logic device is started, it means that the display controller has completed the system power-on, and then the corresponding software can be used to control the display. The controller is configured and displayed on the LED display. However, after the display controller is powered on, the user cannot know whether it is working in a normal state. The user can only judge whether the display controller is normal by turning on the LED display and checking whether the screen is normal. normal working condition
When a problem occurs, it is impossible to know whether the problem is caused by an abnormal hardware circuit or a program loophole. Therefore, it is difficult to find, analyze and troubleshoot the cause of the fault

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Power-on self-test method and power-on self-test device
  • Power-on self-test method and power-on self-test device
  • Power-on self-test method and power-on self-test device

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0028] Such as figure 2 As shown, the first embodiment of the present invention provides a power-on self-test method, which is suitable for a display controller. Specifically, the power-on self-test method provided by the embodiment of the present invention includes, for example, the steps:

[0029] S11: After power-on, use the programmable logic device or microcontroller to detect its own state and judge whether its own state is abnormal to obtain the detection result;

[0030] S12: Record the detection result.

[0031] S13: In response to the abnormality of the detection result, perform processing operations through the programmable logic device and the microcontroller according to the detection result.

[0032] The power-on detection method provided by the embodiment of the present invention is applicable to a display controller. Such as image 3 As shown, the display controller 300 includes: a video input interface 310 , a microcontroller 320 , a programmable logic de...

no. 2 example

[0058] Such as Figure 4 As shown, the second embodiment of the present invention provides a power-on self-detection device 500 . The power-on self-detection device 500 includes, for example, a self-state detection module 510 , a detection result recording module 520 , and an abnormality processing module 530 .

[0059] Self-state detection module 510, used for self-state detection after power-on and judging whether there is abnormality in self-state to obtain detection results, wherein said self-state detection includes: video source interface decoding state detection, communication interface state detection, volatile Memory initialization state detection, internal communication state detection between the programmable logic device and the microcontroller, and the state detection of the working clock required by the programmable logic device.

[0060] Specifically, such as Figure 5 As shown, the self-state detection module 510 includes:

[0061] The video source interface...

no. 3 example

[0070] Such as Image 6 As shown, the third embodiment of the present invention provides a power-on self-test system 600 . Typically, the power-on self-detection system 600 can be, for example, a video processor, a video splicer, a video switcher, and other devices with video and image processing functions such as image and layer movement. The power-on self-test system 600 includes, for example, a memory 610 and a processor 630 connected to the memory 610 . The memory 610 may be, for example, a non-volatile memory on which the computer program 611 is stored. Processor 630 may be, for example, an embedded processor. When the processor 630 runs the computer program 611, it executes the power-on self-detection method in the aforementioned first embodiment.

[0071] For the specific working process and technical effects of the power-on self-test system 600 in this embodiment, refer to the description of the foregoing first embodiment.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses a power-on self-test method and a power-on self-test device suitable for a display controller. The power-on self-test method comprises the following steps: after power-on, testing a self-state through a programmable logic device or a microcontroller, determining whether the self-state is abnormal or not to obtain a test result, recording the test result; and in response to the test result being abnormal, performing processing operation through the programmable logic device and the microcontroller according to the test result. According to the embodiment of the invention, after the display controller is powered on, self-test can be realized, and the test result is recorded so as to be used for searching for, analyzing and troubleshooting fault causes, so that the difficulty of searching for, analyzing and troubleshooting the fault causes is reduced.

Description

technical field [0001] The invention relates to the technical field of equipment detection, in particular to a power-on self-test method and a power-on self-test device. Background technique [0002] In the LED display control system industry, the video source is usually decoded by the display controller, which is output through the network cable as the medium or optical fiber, and then the optical fiber interface is converted into a network port through the photoelectric conversion device to connect the display control card. The network cable is used to connect the control card and the display control card, and the serial connection is used for transmission. The user can configure the screens of multiple display control cards carried by the network port cable of the display controller on the software interface. , to realize the one-to-one correspondence between the display control card and the display screen of the video source, such as figure 1 It is a diagram of the conn...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00G09G3/32
CPCG09G3/006G09G3/32
Inventor 郭佳乐韦桂锋
Owner XIAN NOVASTAR TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More