Power-on self-test method and power-on self-test device
A technology of self-inspection and test results, applied in the direction of instruments, static indicators, etc., can solve problems such as hardware circuit abnormality, fault cause finding, analysis and troubleshooting, and users cannot know that the work is in a normal state, so as to reduce work abnormalities , the effect of reducing difficulty
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no. 1 example
[0028] Such as figure 2 As shown, the first embodiment of the present invention provides a power-on self-test method, which is suitable for a display controller. Specifically, the power-on self-test method provided by the embodiment of the present invention includes, for example, the steps:
[0029] S11: After power-on, use the programmable logic device or microcontroller to detect its own state and judge whether its own state is abnormal to obtain the detection result;
[0030] S12: Record the detection result.
[0031] S13: In response to the abnormality of the detection result, perform processing operations through the programmable logic device and the microcontroller according to the detection result.
[0032] The power-on detection method provided by the embodiment of the present invention is applicable to a display controller. Such as image 3 As shown, the display controller 300 includes: a video input interface 310 , a microcontroller 320 , a programmable logic de...
no. 2 example
[0058] Such as Figure 4 As shown, the second embodiment of the present invention provides a power-on self-detection device 500 . The power-on self-detection device 500 includes, for example, a self-state detection module 510 , a detection result recording module 520 , and an abnormality processing module 530 .
[0059] Self-state detection module 510, used for self-state detection after power-on and judging whether there is abnormality in self-state to obtain detection results, wherein said self-state detection includes: video source interface decoding state detection, communication interface state detection, volatile Memory initialization state detection, internal communication state detection between the programmable logic device and the microcontroller, and the state detection of the working clock required by the programmable logic device.
[0060] Specifically, such as Figure 5 As shown, the self-state detection module 510 includes:
[0061] The video source interface...
no. 3 example
[0070] Such as Image 6 As shown, the third embodiment of the present invention provides a power-on self-test system 600 . Typically, the power-on self-detection system 600 can be, for example, a video processor, a video splicer, a video switcher, and other devices with video and image processing functions such as image and layer movement. The power-on self-test system 600 includes, for example, a memory 610 and a processor 630 connected to the memory 610 . The memory 610 may be, for example, a non-volatile memory on which the computer program 611 is stored. Processor 630 may be, for example, an embedded processor. When the processor 630 runs the computer program 611, it executes the power-on self-detection method in the aforementioned first embodiment.
[0071] For the specific working process and technical effects of the power-on self-test system 600 in this embodiment, refer to the description of the foregoing first embodiment.
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