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Surface defect detection method and system based on depth information

A defect detection and depth information technology, applied in measuring devices, image enhancement, instruments, etc., can solve the problems of high detection accuracy, unreachable, insufficient reflection of defect characteristics, etc., achieve high repeatability, avoid submersion, and high practicability and promotional value

Inactive Publication Date: 2021-07-30
GUANGXI NORMAL UNIV
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Problems solved by technology

[0004] In order to solve the problem that the photometric stereo vision method can not reflect the defect characteristics of the object surface enough to achieve a high detection accuracy, the embodiment of the present invention provides a surface defect detection method and system based on depth information

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  • Surface defect detection method and system based on depth information
  • Surface defect detection method and system based on depth information
  • Surface defect detection method and system based on depth information

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Embodiment Construction

[0037] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and implementation examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0038] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and similar expressions are used herein for purposes of illustration only.

[0039] see figure 1, the first embodiment of the present invention provides a surface defect detection me...

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Abstract

The invention relates to the field of surface defect detection, in particular to a surface defect detection method and system based on depth information. The detection method includes following steps: acquiring an image A of a to-be-measured object under illumination of light sources in different directions; extracting surface gradient data of the to-be-measured object according to the image A, and reconstructing a surface three-dimensional shape of the to-be-measured object according to the surface gradient data; detecting surface defects of the to-be-detected object according to the surface three-dimensional shape of the to-be-detected object; after the surface gradient data of the to-be-measured object is extracted, carrying out integration on the gradient data through a high-pass filter in combination with a Frankot-Chellappa global integration algorithm so as to obtain the surface three-dimensional morphology of the to-be-measured object. The Frankot-Chellappa global integral algorithm is combined with the high-pass filter, so that the high-frequency information of the image can be greatly enhanced, the highlighted high-frequency information can accurately reflect the tiny defects on the surface of the to-be-detected object, and the detection precision when the surface of the to-be-detected object is detected is further improved.

Description

【Technical field】 [0001] The invention relates to the field of surface defect detection, in particular to a method and system for detecting surface defects based on depth information. 【Background technique】 [0002] The current equipment manufacturing industry is in a stage of vigorous development, and with the rapid development of the equipment manufacturing industry, the requirements for the precision of cooperation between parts are getting higher and higher, and the quality of the surface of the parts directly determines the cooperation during assembly Therefore, it is particularly important to perform quality inspection on the surface of parts. [0003] At present, the commonly used detection method is to use the photometric stereo vision method to detect the tiny defects on the surface of the object through the photometric information, but the above detection method still has the phenomenon of insufficient reflection of the defect characteristics on the object surface,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G06T7/155G06T7/80G06T17/00G01N21/956
CPCG06T7/0002G06T7/155G06T7/80G06T17/00G01N21/956G06T5/70
Inventor 朱勇建谢润林
Owner GUANGXI NORMAL UNIV
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