Method for quickly and accurately calibrating slip line by using pole graph analysis
A calibration method and slip line technology, applied in the direction of material analysis using wave/particle radiation, material analysis using measurement of secondary emissions, and material analysis, can solve the problems of difficult and slow calibration of surface slip lines, Achieve accurate judgment, improve research depth, fast and accurate calibration
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specific Embodiment approach 1
[0014] Specific implementation mode 1: In this implementation mode, a method for fast and accurate calibration of slip lines using pole figure analysis is specifically carried out according to the following steps:
[0015] 1. Preliminary preparation: Polish the sample, and then carry out tensile deformation, so that a slip line appears on the surface of the sample, and obtain the sample to be observed; fix the sample to be observed on the sample stage with an inclination angle of 70°, and wait for observation When observing the sample, ensure that the observation surface where the slip line is located is kept parallel to the sample stage, and conduct secondary electron and electron backscattered diffraction analysis in sequence. Scan the same area as the electron backscatter diffraction as the selected scanning area;
[0016] 2. Experimental data processing: select the secondary electron image in the selected scanning area, mark the direction of the slip line to be analyzed on...
specific Embodiment approach 2
[0020] Embodiment 2: This embodiment differs from Embodiment 1 in that the sample material in step 1 is pure titanium, titanium alloy or magnesium alloy with HCP structure. Others are the same as the first embodiment.
specific Embodiment approach 3
[0021] Embodiment 3: This embodiment differs from Embodiment 1 to Embodiment 2 in that: the sample material in step 1 is pure copper or copper alloy with FCC structure. Others are the same as one of the specific embodiments 1 to 2.
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