High-capacity aging test box

A aging test and large-capacity technology, which is applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of not many chips, high heat dissipation requirements, and large volume of test devices, so as to improve heat dissipation capacity and reduce volume Effect

Active Publication Date: 2021-08-13
浙江杭可仪器有限公司
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  • Abstract
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Problems solved by technology

[0003] However, for the automatic aging test device for chips on the market, due to heat dissipation, the general test box can not accommodate many chips (the more chips tested, the higher the heat dissipation requirements), and cannot meet the needs of high output (large capacity)
[0004] Even if a small number of test sets can meet the needs of high production volume, the volume of the test set is large

Method used

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Embodiment Construction

[0030] In order to understand the specific technical solutions, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0031] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "transverse", "longitudinal", "horizontal", "inner", "outer" etc. indicate The orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship that is usually placed when the product of the invention is used, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the It should not be construed as limiting the invention that a device or element must have a particular orientation, be constructed, and operate in a particular ...

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Abstract

The invention discloses a high-capacity aging test box, which comprises a box body, a power supply assembly, a control unit, a plurality of driving board assemblies and an aging board assembly arranged opposite to the driving board assemblies, and is characterized in that the power supply assembly, the control unit, the driving board assemblies and the aging board assembly are all arranged in the box body; the control unit, the driving board assembly and the burn-in board assembly are electrically connected with the power supply assembly, and the driving board assembly and the burn-in board assembly are in signal connection with the control unit; the burn-in board assembly comprises a burn-in board frame, a driving board and a plurality of first fans, and the first fans are arranged on the two sides of the burn-in board respectively to form a first air duct; and the driving plate assembly comprises a driving frame, a plurality of electric conduction and heat conduction pipes, a plurality of second fans and a plurality of driving plates electrically connected with the burn-in plates one by one, the driving plates are arranged on the driving frame in parallel, and the second fans are arranged on the two sides of the driving plates respectively to form second air channels with the driving frame. A large number of chips can be tested at a time, and the size is small.

Description

technical field [0001] The invention relates to the technical field of semiconductor testing, in particular to a large-capacity aging test box. Background technique [0002] With the development of integrated circuits, the demand for chips is increasing. In order to meet the needs of high-quality and high-yield chips, it is usually necessary to perform automatic aging tests on chips. [0003] However, for the automatic aging test device for chips on the market, due to heat dissipation, the general test box can not accommodate many chips (the more chips tested, the higher the heat dissipation requirements), and cannot meet the needs of high output (large capacity) . [0004] Even if a small number of test devices can meet the demands of high throughput, the volume of the test devices is large. Contents of the invention [0005] In order to overcome the deficiencies of the prior art, the object of the present invention is to provide a large-capacity aging test box, which c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04H05K7/20
CPCG01R31/2862G01R31/2863G01R31/2877H05K7/20145
Inventor 曹佶赵宝忠林向前
Owner 浙江杭可仪器有限公司
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