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Shack-Hartmann wavefront sensor measurement system and phase recovery method

A technology of wavefront phase and measurement system, which is applied in the direction of measurement devices, measurement optics, optical radiation measurement, etc., can solve the problems of low measurement efficiency, achieve the effect of improving measurement efficiency, high-speed phase recovery, and realizing phase recovery

Inactive Publication Date: 2021-08-24
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention proposes a high-speed integrated Shaker-Hartmann wavefront measurement system and method

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  • Shack-Hartmann wavefront sensor measurement system and phase recovery method
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  • Shack-Hartmann wavefront sensor measurement system and phase recovery method

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Embodiment Construction

[0034] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0035] Such as figure 1 As shown, the Shack-Hartmann wavefront sensor measurement system includes a Shack-Hartmann wavefront sensor, a GPU core board, and a display unit;

[0036] The Shack-Hartmann wavefront sensor includes a microlens array and a CMOS unit. The microlens array modulates the measured light field image into a spot / dot matrix image. The microlens array is a 56*44 rectangular array, and the CMOS unit is used to collect The speckle image of the measured light field with wavefront phase information modulated by the microlens array, the model of the COMS unit is ON Semiconductor 5000;

[0037] After the GPU core board performs centroid calculation and wavefront phase reconstruction on the speckle image of ...

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Abstract

The invention discloses a Shack-Hartmann wavefront sensor measurement system and a phase recovery method, and solves the problems of separation of measurement, processing and display processes and low measurement efficiency, the Shack-Hartmann wavefront sensor measurement system comprises a Shack-Hartmann wavefront sensor, a GPU core board and a display unit; the Shack-Hartmann wavefront sensor comprises a micro-lens array and a CMOS (Complementary Metal Oxide Semiconductor) unit, the GPU core board comprises a DDR storage unit, a GPU unit and a CPU, an image transmitted from the CMOS unit is received by the GPU core board through a PCIE (Peripheral Component Interface Express) interface, the image is processed and calculated, and the image is displayed through the display unit; according to the Shack-Hartmann wavefront sensor phase recovery method, images are collected in real time through the Shack-Hartmann wavefront sensor, and the GPU core board carries out the steps of contour determination, image normalization, threshold segmentation, centroid calculation, wavefront phase reconstruction and the like on the collected spot images, so that high-speed parallel calculation is achieved; and finally, the original wavefront phase with wavefront fluctuation information is displayed on a display in real time.

Description

technical field [0001] The invention relates to the field of precision measuring instruments, in particular to a Shack-Hartmann wavefront sensor measurement system and a phase recovery method. Background technique [0002] The Shaker-Hartmann wavefront sensor is an instrument capable of detecting the shape of a wavefront, and is used in atmospheric measurement, telescopic measurement, long-distance communication, plasma measurement and other fields. [0003] The measurement and processing of the traditional Shaker-Hartmann wavefront sensor are often separated; after the traditional Shaker-Hartmann wavefront sensor is measured, it needs to be connected to the host computer through a network cable for processing and display, and the host computer The slow calculation speed in processing affects the measurement efficiency, which usually limits the application range of Shack-Hartmann wavefront sensors, and is a difficult problem to overcome. Contents of the invention [0004]...

Claims

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Application Information

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IPC IPC(8): G01J9/00
CPCG01J9/00G01J2009/002
Inventor 范尧段亚轩达争尚
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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