Photoelectric sensor control circuit and control method thereof

Abstract

The invention discloses a photoelectric sensor control circuit and a control method thereof. The photoelectric sensor control circuit comprises a digital circuit and a control circuit; the digital circuit comprises a counting system, a logic circuit and a widening circuit, the counting system comprises a first counter and a second counter, the first counter is used for setting interference pulses which can be accepted, the second counter is used for forming digital filtering, the logic circuit is used for carrying out logic control on the counters, and the widening circuit is used for widening the pulse width; and the control circuit performs logic control on the digital circuit. The photoelectric sensor control circuit has light interference resistance and electromagnetic interference resistance, the time of redundant interference can be set in a combined manner, a high-speed algorithm of a photoelectric sensor is realized by using a universal digital circuit, and high-speed response below 20us can be implemented.

Description

technical field [0001] The invention belongs to the technical field of photoelectric sensors, and in particular relates to a photoelectric sensor control circuit and a control method thereof. Background technique [0002] Photoelectric sensors are increasingly used in the automated production process of all walks of life, but with the widespread use of frequency conversion lights and LED lights, the requirements for the ability of photoelectric sensors to resist light interference are also getting higher and higher. for: [0003] 1. The traditional integral method performs integral operation on the received signal to filter out occasional interference pulses; [0004] 2. ASIC circuit, a special circuit introduced by a major photoelectric sensor manufacturer, uses synchronous detection and digital filtering to filter out non-synchronous interference pulses; [0005] 3. Optical band-pass filter, using the wavelength band-pass characteristics of the band-pass filter, select t...

AI Technical Summary

Problems solved by technology

[0008] 1. The main defect of the integral method is that it cannot perform high-speed response measurement;

[0009] 2. ASIC circuit, the core technology cannot be mastered, and the cost is high;

[0010] 3. Optical bandpass filters are extremely expensive and cannot protect against electromagnetic interference;

[0011] 4. MCU single-chip microcomputer is used as the control core, the cost is relatively high, and the burning program needs to be carried out in the production line

In addition, the response time of the MCU is generally the fastest 30-50us, corresponding to the response time of less than 20us, the cost of the MCU will rise rapidly

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