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Preparation method of hard mask and hard mask

A hard mask, mask technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of small size, thin mask pattern, easy to break, etc., to improve stability and robustness sexual effect

Active Publication Date: 2021-09-24
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] On the one hand, the traditional silicon nitride hard mask is relatively small in size, and most of the mask pattern structures are within tens of microns, which limits its application range; on the other hand, the mask pattern is relatively thin, and it is easy to break Even breakage resulting in lower yield than traditional SiN hard mask

Method used

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  • Preparation method of hard mask and hard mask
  • Preparation method of hard mask and hard mask
  • Preparation method of hard mask and hard mask

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preparation example Construction

[0021] As an aspect of the present invention, an embodiment of the present invention provides a method for preparing a hard mask, comprising: providing a silicon wafer; growing a first silicon nitride layer on the upper surface of the silicon wafer; growing a second silicon nitride layer on the lower surface; growing a first silicon oxide layer on the first silicon nitride layer; etching the first silicon oxide layer and the first silicon nitride layer to form a dry etching mask surface; etching the second The silicon nitride layer forms a wet etching mask surface; a protective layer is grown on the dry etching mask surface and a sealing layer is coated on the protective layer; a pattern is etched on the wet etching mask surface and a supporting layer is reserved; the sealing layer and protection layer are removed Layer, on the surface of the dry etching mask, etch through the support layer according to the pattern to obtain a hard mask.

[0022] figure 1 A flow chart of a me...

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Abstract

The invention discloses a preparation method of a hard mask and the hard mask. The preparation method of the hard mask comprises: providing a silicon wafer; growing a first silicon nitride layer on the upper surface of the silicon wafer, and growing a second silicon nitride layer on the lower surface of the silicon wafer; growing a first silicon oxide layer on the first silicon nitride layer; etching the first silicon oxide layer and the first silicon nitride layer to form a dry etching mask surface; etching the second silicon nitride layer to form a wet etching mask surface; growing a protective layer on the dry etching mask surface and coating a sealing layer on the protective layer; etching a pattern on the wet etching mask surface and reserving a supporting layer; and removing the sealing layer and the protective layer, and etching through the supporting layer on the dry etching mask surface according to the pattern to obtain the hard mask.

Description

technical field [0001] The invention belongs to the technical field of micro-nano processing, and in particular relates to a method for preparing a hard mask and the hard mask. Background technique [0002] The photoresist mask is most commonly used in the field of modern micro-nano processing technology. Although the photoresist mask is relatively dense and has high resolution, because it is a chemical substance, its direct contact with a considerable part of the material will make its performance Therefore, a non-polluting, easy-to-operate and reusable hard mask technology has gradually developed and matured, and silicon nitride hard mask is a typical representative of it. Compared to metal masks, silicon nitride hard masks provide higher resolution and smoother edges; compared to photoresist masks, silicon nitride hard masks do not degrade the properties of the materials they contact , and it can be used repeatedly for one production, which is convenient and easy to oper...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/033
CPCH01L21/0337H01L21/0338Y02P70/50
Inventor 曾长淦郝立龙王秀霞李林范晓东
Owner UNIV OF SCI & TECH OF CHINA