High-speed column line readout circuit and readout method of CMOS image sensor

Abstract

The invention discloses a high-speed column line reading circuit of a CMOS image sensor, and the circuit comprises a pixel unit, wherein the output end of the pixel unit is connected with a column line of a pixel area array, and the column line of the pixel area array is also connected with a current source Ibias, a positive plate of a sampling capacitor CS and the output end of an output transconductance amplifier OTA. A negative plate of the sampling capacitor CS is respectively connected with one end of the sampling resistor RS and an input positive phase end of the output transconductance amplifier OTA, and the current source Ibias, the other end of the sampling resistor RS and an input negative phase end of the output transconductance amplifier OTA are all grounded; the problem that a high-speed reading circuit of an existing large-area-array CMOS image sensor needs to introduce large parasitism is solved.

Description

technical field [0001] The invention belongs to the technical field of image transmission simulation, and in particular relates to a high-speed column line readout circuit of a CMOS image sensor, and also relates to a high-speed column line readout method of a large area array CMOS image sensor. Background technique [0002] The image sensor is an important part of the camera, and currently commonly used image sensors are mainly divided into CMOS image sensors and CCD image sensors. [0003] Due to the characteristics of low power consumption and high frame rate, CMOS image sensors have gained a lot of attention. With the development of high-pixel image sensors, in some high-pixel imaging, a greater requirement is placed on the frame rate of the sensor. Traditional high-pixel CMOS image sensors have been unable to meet the requirements. [0004] On this basis, others have proposed a high-speed readout circuit for a traditional large area array CMOS image sensor. The circui...

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to provide a high-speed column line readout circuit of a CMOS image sensor, which overcomes the problem that the high-speed readout circuit of the existing large area array CMOS image sensor needs to introduce relatively large parasitic

[0008] Another object of the present invention is to provide a high-speed column line readout method of a large area array CMOS image sensor, which solves the problem of slow establishment of the reset signal and the integral signal in the signal readout process of the large area array CMOS image sensor. The problem that the readout time of the reset signal and the integrated signal is too long

Images