IGBT chip test platform
A technology of chip testing and test bench, which is applied in bipolar transistor testing, single semiconductor device testing, etc., can solve the problems of inability to effectively improve the detection efficiency of IGBT chips, inability to detect probe switching, and low degree of automation, so as to achieve automatic testing , Speed up the work rhythm and improve production efficiency
Inactive Publication Date: 2021-11-05
深圳市芯愚公半导体有限公司
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Problems solved by technology
In the production process of IGBT chips, it is necessary to detect the IGBT chips and determine the polarity of the pins. In the daily production process, it is usually done by manual detection, which has low detection efficiency and high labor intensity. However, the existing IGBT chips The detection equipment cannot make the detection probe switch between the pins of the IGBT chip, the degree of automation is not high, and the detection efficiency of the IGBT chip cannot be effectively improved
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[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0035] As introduced in the background technology, there are deficiencies in the prior art. In order to solve the above technical problems, this application proposes an IGBT chip testing platform.
[0036] In a typical implementation of the present application, such as Figure 1-9Shown, a kind of IGBT chip testing platform comprises test bench (1), IGBT tester (2), and test bench (1) is equipped with jig assembly (3), and jig assembly (3) is provided with firs...
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The invention relates to the technical field of IGBT chip test platforms and particularly relates to an IGBT chip test platform. According to the IGBT chip test platform, a pin switching assembly is arranged, pins of an IGBT chip are switched out of a jig through the pin switching assembly, then a probe of an IGBT tester can be automatically switched among the pins of the IGBT chip through a detection probe switching structure when the IGBT chip is tested, and therefore automatic testing of the IGBT chip is achieved, and detection efficiency of the IGBT chip is improved. Two IGBT chip testing stations are arranged, when one IGBT chip testing station is in a testing state, the other IGBT chip testing station is in a feeding state, and the two IGBT chip testing stations are switched between a testing state and a feeding state in turn, so testing pause caused by feeding of the platform is avoided, the working rhythm of equipment is accelerated, and production efficiency is further improved.
Description
technical field [0001] The invention relates to the technical field of IGBT chip test platforms, in particular to an IGBT chip test platform. Background technique [0002] IGBT (Insulated Gate Bipolar Transistor), an insulated gate bipolar transistor, is a composite fully-controlled voltage-driven power semiconductor device composed of BJT (bipolar transistor) and MOS (insulated gate field effect transistor), and has a MOSFET The advantages of high input impedance and low conduction voltage drop of GTR. Its three poles are collector (C), emitter (E) and gate (G). In the production process of IGBT chips, it is necessary to detect the IGBT chips and determine the polarity of the pins. In the daily production process, it is usually done by manual detection, which has low detection efficiency and high labor intensity. However, the existing IGBT chips The detection equipment also cannot switch the detection probe between the pins of the IGBT chip, and the degree of automation i...
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IPC IPC(8): G01R31/26
CPCG01R31/2608
Inventor 向晟
Owner 深圳市芯愚公半导体有限公司