MCU (Microprogrammed Control Unit)-based high-voltage-resistant double-isolation CAN (Controller Area Network) transceiver test circuit technical device
A technical device and testing circuit technology, applied in the direction of data exchange, electrical components, digital transmission system, etc. through path configuration, can solve the problems of inability to directly test the withstand voltage capability, cumbersome scheme design, low reliability, etc., and achieve good practicality. The effect of value, improved reliability and ease of implementation
Pending Publication Date: 2021-11-12
58TH RES INST OF CETC
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Problems solved by technology
[0003] The present invention is mainly aimed at the test method in the prior art that can only support the test of the withstand voltage capability of the CAN bus connector without power supply, but cannot directly test the withstand voltage capability under the working state, and the design of the scheme is cumbersome and the reliability is not high. Problem, provide a kind of high withstand voltage dual isolation CAN transceiver test circuit technical device based on MCU; By adopting general-purpose MCU and dual-channel CAN transceiver as the core, set USB communication interface chip, SD card memory chip, LCD display screen, 4.2 V general-purpose lithium battery and configuration circuit chip circuit, which improves the reliability and easy realization of the test, and has good practical value
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[0015] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.
[0016] The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Of course, they are only examples and are not intended to limit the invention. Furthermore, the present disclosure may repeat reference numerals and / or reference letters in different instances, such repetition is for simplicity and clarity and does not in itself indicate a rela...
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The invention discloses an MCU (Microprogrammed Control Unit)-based high-voltage-resistant double-isolation CAN (Controller Area Network) transceiver test circuit technical device, which belongs to the technical field of test circuits and comprises a data signal processing and detecting device and an FR4 substrate, the data signal processing and detecting device comprises a signal processing chip, a general MCU (Microprogrammed Control Unit), a dual-path CAN (Controller Area Network) transceiver, a USB (Universal Serial Bus) communication interface chip, an SD (Secure Digital) card storage chip, an LCD (Liquid Crystal Display) screen, a 4.2 V general lithium battery and a configuration circuit chip, and the general MCU, the dual-path CAN transceiver, the USB communication interface chip, the SD card storage chip, the LCD screen and the configuration circuit chip are connected to the upper surface of the FR4 substrate; and the general MCU and the two-way CAN transceiver are arranged in a double-isolation manner. According to the invention, the reliability and the feasibility of the test are improved, and the practical value is good.
Description
technical field [0001] The invention relates to the technical field of testing circuits, in particular to an MCU-based high withstand voltage double-isolation CAN transceiver testing circuit technical device. Background technique [0002] CAN bus connectors have the advantages of low development and maintenance costs, high bus utilization, and high transmission rates. They have been widely used in various automation scenarios such as automotive electronics, smart cities, and smart homes. They have broad usage scenarios and user bases. In order to meet the application in various fields, the CAN bus connector must have high reliability and be able to adapt to a variety of harsh conditions, including the ability to withstand voltage under certain working conditions. The traditional test method can only support in Testing the withstand voltage capability of the CAN bus connector without power supply cannot directly test the withstand voltage capability under working conditions. ...
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IPC IPC(8): H04L12/26H04L12/40
CPCH04L43/50H04L12/40H04L2012/40215
Inventor 张文强李居强闫传荣顾林
Owner 58TH RES INST OF CETC
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