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X-ray detection array pixel unit, manufacturing process and double-layer energy spectrum CT detector

A detection array and pixel unit technology, applied in X/γ/cosmic radiation measurement, radiation measurement, radiation intensity measurement, etc., can solve complex processing and assembly process, occupy detector sensitive area, unfavorable detector mass production and cost Control and other issues

Pending Publication Date: 2021-11-19
NANJING ANKE MEDICAL TECH CO LTD
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  • Abstract
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Problems solved by technology

[0004] The existing double-layer spectral CT detector adopts the side-coupling design between the scintillator sub-pixel and the photosensitive array sub-pixel, which determines its two main disadvantages that cannot be avoided: (1) The detector unit must use physically separated scintillation Volume pixels and photosensitive array pixels are assembled through three-dimensional precision integration, and its complex processing and assembly technology is not conducive to mass production and cost control of detectors; (2) In the direction of X-ray incidence, photosensitive array pixels will occupy a certain amount of sensitive detector space. area, thus affecting the imaging dose efficiency

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  • X-ray detection array pixel unit, manufacturing process and double-layer energy spectrum CT detector
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  • X-ray detection array pixel unit, manufacturing process and double-layer energy spectrum CT detector

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Embodiment Construction

[0040] The present invention proposes a double-layer energy spectrum CT detector. In the pixel structure design of the double-layer CT detector, a two-dimensional continuous double-layer scintillator array, a photosensitive array, and a pixelated thin-film light filter layer are processed. become.

[0041] Two-layer scintillator arrays use different top and bottom scintillator materials, according to Figure 8 The process steps shown are processed. Under X-ray irradiation, the scintillator materials of the top and bottom scintillator sub-pixels have clearly distinguishable different emission spectra, which can be distinguished by color filtering. The scintillator sub-pixels on the top layer and the bottom layer are directly optically coupled, and the light emitted from the scintillator sub-pixels on the top layer can penetrate through the scintillator sub-pixels on the bottom layer to reach the light output surface. There is a thin-film light filter layer between the scintil...

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Abstract

The invention discloses an X-ray detection array pixel unit, a manufacturing process of a double-layer scintillator array and a double-layer energy spectrum CT detector based on the pixel unit. The pixel unit comprises a top-layer scintillator pixel, a bottom-layer scintillator pixel, a film light filtering layer, a photosensitive array and the like, sub-pixels of a top-layer scintillator array and a bottom-layer scintillator array are formed by processing scintillator materials emitting different spectrums, the thin film light filtering layer corresponds to the light output face of each scintillator pixel, pixels of the photosensitive array are divided into two independent sub-pixel areas, output signals correspond to X-ray responses of the top-layer scintillator pixel and the bottom-layer scintillator pixel respectively, and the energy spectrum information of the incident X-ray can be effectively obtained. The double-layer scintillator array adopts a two-dimensional array processing technology, the integration technology of the detector sub-module adopts a superposition assembly technology which is the same as that of a conventional CT detector, the sensitive area of the detector is not influenced, the imaging dosage efficiency can be effectively maintained, and the cost of the detector can be effectively controlled.

Description

technical field [0001] The invention relates to the field of semiconductor photodetectors, in particular to an X-ray detection array pixel unit, a double-layer scintillator array manufacturing process and a double-layer energy spectrum CT detector. Background technique [0002] The X-ray response signal collected in conventional CT is proportional to the energy integral of all X-rays with different energies detected by the detector, which does not contain any energy spectrum information of X-rays. Spectral CT, which has been developed rapidly in recent years, obtains more image information than conventional CT by collecting and distinguishing the response signals of X-rays with different energies. Possibility, the image quality, dose efficiency and accuracy of clinical diagnosis have been significantly improved on the basis of conventional CT. Spectral CT technology and application research has become an important development direction of CT medical imaging technology. [...

Claims

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Application Information

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IPC IPC(8): G01T1/161G01T1/16G01T1/20G01T1/202G01T1/24
CPCG01T1/161G01T1/1603G01T1/202G01T1/2002G01T1/2008G01T1/246G01T1/243
Inventor 李文黄海波吴小页
Owner NANJING ANKE MEDICAL TECH CO LTD