Multifunctional test equipment with thermal stress test and test method of multifunctional test equipment

Abstract

The invention discloses multifunctional test equipment with a thermal stress test. The multifunctional test equipment comprises an upper computer PC, an electrical controller, a test cabinet, a load, a data acquisition device and a carrying manipulator, wherein the test cabinet comprises a workbench, a test box, a test tool and a thermal stress test assembly, and the test box is provided with a temperature color-changing adhesive. The invention further discloses a test method. By realizing full-automatic test of the power electronic product, synchronous test of current stress, voltage stress and thermal stress can be realized, the test time is shortened, the aging process test efficiency of the power electronic product is improved, the quality of the product is predicted according to the thermal stress allowance, the time is short, the test is more accurate, bad products can be predicted in advance, more influences caused by bad products are avoided, the test efficiency is improved while the test precision is ensured, and the test cost is reduced.

Description

technical field [0001] The invention relates to the technical field of electronic hardware environmental stress testing equipment, in particular to a multifunctional testing equipment with thermal stress testing and a testing method thereof. Background technique [0002] Aging of power electronic products belongs to Environmental Stress Screening (ESS), which is a very popular quality and reliability assurance method for modern high-tech electronic products. As the name implies, environmental stress screening is to use external environmental stress to expose the defects hidden in electronic hardware due to factors such as weak components and poor workmanship in the early stage and expose them. It is mainly used in circuit boards, relays, and fuses. The test of power electronic hardware such as resistors can determine the service life and performance effect of power electronic hardware. At present, the usual practice is to run the product at the upper limit of the working en...

AI Technical Summary

Problems solved by technology

[0003] The aging of existing power electronic products belongs to environmental stress screening, and testing equipment such as aging cabinets are often used to test power electronic products. Traditional testing equipment can only provide current stress and voltage stress testing and data collection, so as to be used for aging The judgment of the test, and power electronic products often generate extra heat during use, and the release of heat will also affect the aging process of power electronic products, so the temperature of power electronic products is also one of the important judgment data of the existing aging process , the existing test equipment has no thermal stress test function. Usually, after the current stress and voltage stress test and data collection are completed, the product to be tested is transferred to the temperature detection equipment for detection and analysis or manual temperature measurement. The temperature of the product to be tested will be affected by external factors, and there are manual errors in manual temperature measurement. Both of the above two methods will lead to errors in the detection data, which will affect the accuracy of subsequent judgments, and the entire test process takes a long time, affecting the efficiency of test screening; Moreover, the existing test equipment has a low degree of automation, requiring manual loading and unloading of the product to be tested, as well as the operation of connection and fixation. The manual labor intensity is high and there are many steps, and manual handling will lead to adhesion on the surface of the product to be tested. Impurities affect the cleanliness of the product to be tested, thereby affecting the accuracy of the final test results. Existing test equipment cannot provide a variety of test environments according to requirements, and cannot meet the test requirements of existing power electronic products.

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